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Author: A. H. Guenther
Publisher: ASTM International
ISBN:
Category : Interferometers
Languages : en
Pages : 176
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Book Description
Author: A. H. Guenther
Publisher: ASTM International
ISBN:
Category : Interferometers
Languages : en
Pages : 176
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Book Description
Author: Arthur Henry Guenther
Publisher:
ISBN:
Category : Diffraction
Languages : en
Pages : 178
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Book Description
Author: Zacarias Malacara
Publisher: CRC Press
ISBN: 1420027271
Category : Science
Languages : en
Pages : 568
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Book Description
In this day of digitalization, you can work within the technology of optics without having to fully understand the science behind it. However, for those who wish to master the science, rather than merely be its servant, it's essential to learn the nuances, such as those involved with studying fringe patterns produced by optical testing interferometers. When Interferogram Analysis for Optical Testing originally came to print, it filled the need for an authoritative reference on this aspect of fringe analysis. That it was also exceptionally current and highly accessible made its arrival even more relevant. Of course, any book on something as cutting edge as interferogram analysis, no matter how insightful, isn't going to stay relevant forever. The second edition of Interferogram Analysis for Optical Testing is designed to meet the needs of all those involved or wanting to become involved in this area of advanced optical engineering. For those new to the science, it provides the necessary fundamentals, including basic computational methods for studying fringe patterns. For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education. Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.
Author:
Publisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 169
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Book Description
Author: Daniel Malacara
Publisher: CRC Press
ISBN: 9780824799403
Category : Technology & Engineering
Languages : en
Pages : 458
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Book Description
"Lays out the fundamentals of, as well as computational methods for, studying fringe patterns produced by optical testing interferometers--providing beginners with the necessary background to enter this field and helping seasoned researchers to refine current analytical approaches. Discusses classical and state-of-the-art fringe analysis techniques with exceptional clarity."
Author: Daniel Malacara
Publisher: John Wiley & Sons
ISBN: 0471484040
Category : Science
Languages : en
Pages : 882
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Book Description
The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.
Author: Los Alamos Scientific Laboratory
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 256
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Book Description
Author: Los Alamos National Laboratory
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 348
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Book Description
Author:
Publisher:
ISBN:
Category : Astronomical instruments
Languages : en
Pages : 332
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Book Description
Author: George N. Lawrence
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 784
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Book Description
