Optical Excitation in Scanning Tunneling Microscopy: from Surface Photovoltages to Charge Dynamics Oin the Atomic Scale PDF Download
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Author: Philipp Kloth
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
In this thesis, the successful implementation of optical excitation for time-resolved Scanning Tunneling Microscopy (STM) is presented. The fruitful combination of these two experimental methods allows investigating photo-induced dynamic processes on the nanosecond time scale with atomic resolution. The optical setup provides a great versatility regarding the adjustment of excitation parameters such as optical pulse height, pulse width or pulse repetition rate to the experimental needs. Moreover, for the first time, it is possible to disentangle and quantify thermally induced effects, e.g. ...
Author: Philipp Kloth
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
In this thesis, the successful implementation of optical excitation for time-resolved Scanning Tunneling Microscopy (STM) is presented. The fruitful combination of these two experimental methods allows investigating photo-induced dynamic processes on the nanosecond time scale with atomic resolution. The optical setup provides a great versatility regarding the adjustment of excitation parameters such as optical pulse height, pulse width or pulse repetition rate to the experimental needs. Moreover, for the first time, it is possible to disentangle and quantify thermally induced effects, e.g. ...
Author: Joseph A. Stroscio
Publisher: Academic Press
ISBN: 1483292878
Category : Science
Languages : en
Pages : 481
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Book Description
Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
Author: Suchit Sharma
Publisher: GRIN Verlag
ISBN: 3668588252
Category : Technology & Engineering
Languages : en
Pages : 21
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Book Description
Literature Review from the year 2015 in the subject Engineering - General, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical "touch" while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist’s lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations. The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide.
Author: C. Julian Chen
Publisher: Oxford University Press
ISBN: 0198023561
Category : Science
Languages : en
Pages : 472
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Book Description
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
Author: Adam Foster
Publisher: Springer Science & Business Media
ISBN: 0387372318
Category : Technology & Engineering
Languages : en
Pages : 292
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Book Description
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
Author: Hans-Joachim Güntherodt
Publisher: Springer Science & Business Media
ISBN: 3642973434
Category : Science
Languages : en
Pages : 252
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Book Description
Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment. In this volume the reader will find a detailed description of the technique itself and of its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original work will help to make accessible the vast body of knowledge already accumulated in this field.
Author: T. Sakurai
Publisher: Springer
ISBN:
Category : Juvenile Nonfiction
Languages : en
Pages : 362
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Book Description
This is a comprehensive presentation of the current knowledge on the electronic properties and manipulation of semiconductor surfaces. This book covers several of the most important and timely topics at the forefront of scanning probe microscopy, such as atom-resolving atomic force microscopy (AFM), application of atom manipulation for fabricating nanoscale and atomic scale structures, theoretical insights into Fullerenes, and atomic manipulation for future single-electron devices.
Author: Roland Wiesendanger
Publisher: Springer Science & Business Media
ISBN: 9783540638155
Category : Science
Languages : en
Pages : 238
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Book Description
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
Author: Roland Wiesendanger
Publisher: Cambridge University Press
ISBN: 9780521428477
Category : Science
Languages : en
Pages : 664
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Book Description
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Author: Roland Wiesendanger
Publisher: Springer
ISBN:
Category : Science
Languages : en
Pages : 372
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Book Description
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed.
