Author: Himal KhatriPublisher:
ISBN:
Category : Copper indium selenide
Languages : en
Pages : 296
Book Description
Molybdenum (Mo) is currently the most common material used for Cu(In, Ga)Se2 solar cell back contacts. The first objective of this study is to utilize in-situ and ex-situ characterization techniques to investigate the growth, as well as the physical and chemical properties, of Mo thin films deposited by RF magnetron sputtering onto soda-lime glass (SLG) substrates. The effects of the deposition pressure on the nucleation and growth mechanisms that ultimately influence morphology and grain structure have been studied. Correspondence between real time spectroscopic ellipsometry (RTSE), X-ray diffraction (XRD), atomic force microscopy (AFM), and four-point probe resistivity measurements indicate that increasing deposition pressure leads to smaller average grain sizes and higher oxygen content in the Mo thin films. Changes of the material properties were also evaluated by changing RF power. It is observed that higher RF power, results in higher conductivity films. The second and overall objective of this work is to focus on the deposition and characterization of the Cu(In, Ga)Se2 absorber layer using the hybrid co-sputtering and evaporation process, which has potential for commercial PV. Solar cells were completed with a range of elemental compositions in the absorber layer, keeping a constant profile of Ga and varying Cu concentrations. The slightly Cu deficient Cu(In, Ga)Se2 films of band gap ~1.15 eV fabricated by this process consist of a single chalcopyrite phase and device efficiencies up to 12.4% were achieved for the composition ratios (x, y) = (0.30, 0.88). Correspondence between energy dispersive X-ray spectroscopy (EDS), X-ray diffraction, transmission and reflection (T & R), four-point probe resistivity, and current density-voltage (J-V) measurements indicate that increased Cu concentration leads to the incorporation of a secondary phase Cu2-xSe compound in the Cu(In, Ga)Se2 films, which is detrimental to cell performance. The third objective of this work is to evaluate the Cu2-xSe material properties by employing in-situ RTSE, as well as ex-situ SE and various other characterization techniques. SE revealed that the dielectric function spectra of Cu2-xSe evolve with temperature, providing insights into the evolution of transport properties and critical point structures. At room temperature, semi-metallic behavior of Cu2-xSe thin films was revealed by SE and Hall Effect measurements. These characteristics serve as key inputs for optical modeling of complex layer structures of Cu(In, Ga)Se2 films grown by 2- and 3-step processes.
