Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 148
Book Description
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 148
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 148
Book Description
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 160
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 108
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 108
Book Description
Journal of Research of the National Bureau of Standards
Author:
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 1092
Book Description
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 1092
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
Journal of Research of the National Institute of Standards and Technology
Author:
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 824
Book Description
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 824
Book Description
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Semiconductor Measurement Technology
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 72
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 72
Book Description
Narrow-Gap Semiconductors and Related Materials, Proceedings of the INT Conference on Narrow-Gap Semiconductors and Related Materials, NIST, Gaithersburg, June 12-15, 1989
Author: David G. Seiler
Publisher: CRC Press
ISBN: 9780852742105
Category : Science
Languages : en
Pages : 364
Book Description
The special characteristics of narrow-gap semiconductors have long been recognised, not only for their interesting physical effects, but also for their technological applications. Such materials are found across a wide range of elements, compounds and alloys. The International Conference on Narrow-gap Semiconductors and Materials (NIST, Gaithersburg) reviewed past research into the physics of both materials and devices, and summarised the present position, in the light of recent rapid developments in the semiconductor field. This major conference, the first of its kind since 1981, drew together 158 delegates from 14 countries. Invited reviews and invited and contributed papers covered III-VI, III-V and IV-VI compounds and various alloys. Topics considered ranged from the characterisation of artifically structured materials to the physics of infrared detector devices, as well as a review of high-Tc superconductors for infrared detection; this diversity is reflected in the reviews and papers presented here. This book will be of value to all scientists and engineers interested in narrow-gap semiconductors and needing to keep up to date with the rapid advances in this area.
Publisher: CRC Press
ISBN: 9780852742105
Category : Science
Languages : en
Pages : 364
Book Description
The special characteristics of narrow-gap semiconductors have long been recognised, not only for their interesting physical effects, but also for their technological applications. Such materials are found across a wide range of elements, compounds and alloys. The International Conference on Narrow-gap Semiconductors and Materials (NIST, Gaithersburg) reviewed past research into the physics of both materials and devices, and summarised the present position, in the light of recent rapid developments in the semiconductor field. This major conference, the first of its kind since 1981, drew together 158 delegates from 14 countries. Invited reviews and invited and contributed papers covered III-VI, III-V and IV-VI compounds and various alloys. Topics considered ranged from the characterisation of artifically structured materials to the physics of infrared detector devices, as well as a review of high-Tc superconductors for infrared detection; this diversity is reflected in the reviews and papers presented here. This book will be of value to all scientists and engineers interested in narrow-gap semiconductors and needing to keep up to date with the rapid advances in this area.
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 464
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 464
Book Description
Government reports annual index
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 1322
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 1322
Book Description