Nanometer Technology Designs PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Nanometer Technology Designs PDF full book. Access full book title Nanometer Technology Designs by Nisar Ahmed. Download full books in PDF and EPUB format.
Author: Nisar Ahmed
Publisher: Springer Science & Business Media
ISBN: 0387757287
Category : Technology & Engineering
Languages : en
Pages : 288
Get Book Here
Book Description
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Author: Nisar Ahmed
Publisher: Springer Science & Business Media
ISBN: 0387757287
Category : Technology & Engineering
Languages : en
Pages : 288
Get Book Here
Book Description
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Author: Andrei Pavlov
Publisher: Springer Science & Business Media
ISBN: 1402083637
Category : Technology & Engineering
Languages : en
Pages : 203
Get Book Here
Book Description
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
Author: Harry J.M. Veendrick
Publisher: Springer
ISBN: 3319475975
Category : Technology & Engineering
Languages : en
Pages : 639
Get Book Here
Book Description
This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.
Author: Siva G. Narendra
Publisher: Springer Science & Business Media
ISBN: 9780387281339
Category : Technology & Engineering
Languages : en
Pages : 308
Get Book Here
Book Description
Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. Case studies supply real-world examples that reap the benefits of leakage power reduction solutions as the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.
Author: António Manuel Lourenço Canelas
Publisher: Springer Nature
ISBN: 3030415368
Category : Technology & Engineering
Languages : en
Pages : 254
Get Book Here
Book Description
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.
Author: Hassan Hassan
Publisher: Morgan Kaufmann
ISBN: 0080922341
Category : Technology & Engineering
Languages : en
Pages : 257
Get Book Here
Book Description
Low-Power Design of Nanometer FPGAs Architecture and EDA is an invaluable reference for researchers and practicing engineers concerned with power-efficient, FPGA design. State-of-the-art power reduction techniques for FPGAs will be described and compared. These techniques can be applied at the circuit, architecture, and electronic design automation levels to describe both the dynamic and leakage power sources and enable strategies for codesign. - Low-power techniques presented at key FPGA design levels for circuits, architectures, and electronic design automation, form critical, "bridge" guidelines for codesign - Comprehensive review of leakage-tolerant techniques empowers designers to minimize power dissipation - Provides valuable tools for estimating power efficiency/savings of current, low-power FPGA design techniques
Author: Swarup Bhunia
Publisher: Springer Science & Business Media
ISBN: 1441974180
Category : Technology & Engineering
Languages : en
Pages : 444
Get Book Here
Book Description
Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.
Author: Ban Wong
Publisher: John Wiley & Sons
ISBN: 0471678864
Category : Technology & Engineering
Languages : en
Pages : 413
Get Book Here
Book Description
Based on the authors' expansive collection of notes taken over the years, Nano-CMOS Circuit and Physical Design bridges the gap between physical and circuit design and fabrication processing, manufacturability, and yield. This innovative book covers: process technology, including sub-wavelength optical lithography; impact of process scaling on circuit and physical implementation and low power with leaky transistors; and DFM, yield, and the impact of physical implementation.
Author: Mohamed Abu Rahma
Publisher: Springer Science & Business Media
ISBN: 1461417481
Category : Technology & Engineering
Languages : en
Pages : 176
Get Book Here
Book Description
Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.
Author: Nadine Azemard
Publisher: Springer
ISBN: 3540744428
Category : Computers
Languages : en
Pages : 596
Get Book Here
Book Description
This volume features the refereed proceedings of the 17th International Workshop on Power and Timing Modeling, Optimization and Simulation. Papers cover high level design, low power design techniques, low power analog circuits, statistical static timing analysis, power modeling and optimization, low power routing optimization, security and asynchronous design, low power applications, modeling and optimization, and more.
