Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 66
Book Description
Multiple Scattering Corrections for Associated-particle Neutron Time-of-flight Technique [with List of References
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 66
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 66
Book Description
Multiple Scattering Corrections for the Associated-particle Neutron Time-of-flight Technique
Author: Allan C. B. Richardson
Publisher:
ISBN:
Category : Fast neutrons
Languages : en
Pages : 72
Book Description
The computer code, MAGGIE, for the calculation of multiple scattering and sample attenuation in neutron differential cross-section measurements, has been revised and corrected.The particular case of the scattering geometry required by the associated-particle time-of-flight is considered in detail.(Author).
Publisher:
ISBN:
Category : Fast neutrons
Languages : en
Pages : 72
Book Description
The computer code, MAGGIE, for the calculation of multiple scattering and sample attenuation in neutron differential cross-section measurements, has been revised and corrected.The particular case of the scattering geometry required by the associated-particle time-of-flight is considered in detail.(Author).
Multiple Scattering Corrections For the Associated-Particle Neutron Time-Of-Flight Technique
Author: Allan C. B. Richardson
Publisher:
ISBN:
Category :
Languages : en
Pages : 66
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 66
Book Description
Monthly Catalogue, United States Public Documents
Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1250
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1250
Book Description
Technical News Bulletin
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 320
Book Description
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 320
Book Description
Technical News Bulletin
Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 24
Book Description
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 24
Book Description
Technical News Bulletin of the National Bureau of Standards
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 900
Book Description
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 900
Book Description
Dimensions
Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 616
Book Description
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 616
Book Description
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1540
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1540
Book Description
Soft-Matter Characterization
Author: Redouane Borsali
Publisher: Springer Science & Business Media
ISBN: 140204464X
Category : Science
Languages : en
Pages : 1490
Book Description
This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.
Publisher: Springer Science & Business Media
ISBN: 140204464X
Category : Science
Languages : en
Pages : 1490
Book Description
This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.