Author: Gholam-Reza Fadakar
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 118
Book Description
Multiple Fault Detection for Combinational Circuits
Author: Gholam-Reza Fadakar
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 118
Book Description
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 118
Book Description
Multiple Fault Detection in Combinational Circuits
Author: Sivanarayana Mallela
Publisher:
ISBN:
Category :
Languages : en
Pages : 128
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 128
Book Description
Multiple Fault Detection in Combinational Circuits
Author: Min-Wen Du
Publisher:
ISBN:
Category :
Languages : en
Pages : 198
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 198
Book Description
Functional Method for Multiple Fault Detection and Location in Combinational Circuits
Author: Ka Ngow Wong
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 124
Book Description
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 124
Book Description
Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 36
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 36
Book Description
Digital Circuit Testing and Testability
Author: Parag K. Lala
Publisher: Academic Press
ISBN: 9780124343306
Category : Computers
Languages : en
Pages : 222
Book Description
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Publisher: Academic Press
ISBN: 9780124343306
Category : Computers
Languages : en
Pages : 222
Book Description
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Fault Detection for Combinational Logic Under the Multiple Fault Assumption
Author: Patrick Wai-Fai Lam
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 92
Book Description
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 92
Book Description
Multiple Fault Detection in Combinational Network Topologies
Author: Carlos E. Tobon
Publisher:
ISBN:
Category :
Languages : en
Pages : 488
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 488
Book Description
Multiple Faults in Combinational Logic
Author: H. G. Shah
Publisher:
ISBN:
Category :
Languages : en
Pages : 72
Book Description
The problem of multiple fault detection in combinational logic network is addressed. A number of test set generation procedures are discussed. A couple of methods to reduce number of faults to be considered in test generation procedures are also discussed. The later approaches study topological aspects of networks. An EXCLUSIVE-OR method is developed which yields a general Boolean expression implying the complete test set for any specified multiple fault. This method is compared with other similar approaches appearing in recent literature. (Author).
Publisher:
ISBN:
Category :
Languages : en
Pages : 72
Book Description
The problem of multiple fault detection in combinational logic network is addressed. A number of test set generation procedures are discussed. A couple of methods to reduce number of faults to be considered in test generation procedures are also discussed. The later approaches study topological aspects of networks. An EXCLUSIVE-OR method is developed which yields a general Boolean expression implying the complete test set for any specified multiple fault. This method is compared with other similar approaches appearing in recent literature. (Author).
Multiple Fault Detection in Logic Circuits
Author: Shih-Chien Yang
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages :
Book Description