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Author: Ireneusz Mrozek
Publisher: Springer
ISBN: 3319912046
Category : Technology & Engineering
Languages : en
Pages : 142
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Book Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Author: Ireneusz Mrozek
Publisher: Springer
ISBN: 3319912046
Category : Technology & Engineering
Languages : en
Pages : 142
Get Book Here
Book Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Author: Ireneusz Mrozek
Publisher:
ISBN: 9783319912059
Category : Computer storage devices
Languages : en
Pages :
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Book Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Author: Whitson G. Waldo
Publisher: First Books
ISBN: 1592994830
Category : Business & Economics
Languages : en
Pages : 314
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Book Description
A Fully Integrated Presentation of New Hardware and Software Product Introductions Using Program Management Methodologies for System on Chip Platforms If you're an executive, manager, or engineer in the semiconductor, software, or systems industries, this book provides conceptual views ranging from the design of integrated circuits or systems on a chip, through fabrication, to integration of chips onto boards, and through development of enablement and runtime software for system and platform deliveries. Special features included this book are: - Program management methodologies - General management fundamentals - An overview of leadership principles - Basic discrete device technology - Internal structure and operation of some common logic gates - Basic integrated circuit design concepts, building blocks, and flow - Chip packaging technologies - Details of the fabrication process for integrated circuits - Printed circuit board design, manufacture, and test - Software design, development, and test - Integrated circuit test, silicon validation, and device qualification - Program management applications bringing it all together The book explores interactions and dependencies of technologies that impact systems and platforms. This is a valuable resource to learn these technologies or to use as a reference.
Author: Kenli Li
Publisher: Springer
ISBN: 3642539629
Category : Computers
Languages : en
Pages : 626
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Book Description
This book constitutes the refereed proceedings of the 25th International Conference on Parallel Computational Fluid Dynamics, ParCFD 2013, held in Changsha, China, in May 2013. The 35 revised full papers presented were carefully reviewed and selected from more than 240 submissions. The papers address issues such as parallel algorithms, developments in software tools and environments, unstructured adaptive mesh applications, industrial applications, atmospheric and oceanic global simulation, interdisciplinary applications and evaluation of computer architectures and software environments.
Author: Kanad Chakraborty
Publisher: Prentice Hall PTR
ISBN:
Category : Computers
Languages : en
Pages : 456
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Book Description
This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and explains what needs to be done and why for each of the techniques.
Author: Luciano Lavagno
Publisher: CRC Press
ISBN: 1351830996
Category : Technology & Engineering
Languages : en
Pages : 773
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Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author: ASM International
Publisher: ASM International
ISBN: 1627081518
Category : Technology & Engineering
Languages : en
Pages : 666
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Book Description
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author: Ulrich Golze
Publisher: Springer Science & Business Media
ISBN: 3642610013
Category : Computers
Languages : en
Pages : 363
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Book Description
The art of transforming a circuit idea into a chip has changed permanently. Formerly, the electrical, physical and geometrical tasks were predominant. Later, mainly net lists of gates had to be constructed. Nowadays, hardware description languages (HDL) similar to programming languages are central to digital circuit design. HDL-based design is the main subject of this book. After emphasizing the economic importance of chip design as a key technology, the book deals with VLSI design (Very Large Scale Integration), the design of modern RISC processors, the hardware description language VERILOG, and typical modeling techniques. Numerous examples as well as a VERILOG training simulator are included on a disk.
Author: Nick Moffat
Publisher: Springer
ISBN: 1489945237
Category : Psychology
Languages : en
Pages : 335
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Book Description
Author: Barbara Wilson
Publisher: Psychology Press
ISBN: 1317685539
Category : Psychology
Languages : en
Pages : 340
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Book Description
Many patients with stroke, head injuries or dementia suffer severe memory impairment and in many cases improvement may fail to occur. This book, first published in 1984 followed by this second edition in 1992, offers practical guidelines to the problems and is supported by a discussion of theory about memory systems and functioning. It should enable therapists and psychologists to recognize, understand, assess and manage memory problems arising from injury, accident or infection of the brain. The authors are well-known for their interest in memory and memory therapy. Topics covered in this text include: the relationship between memory and practice, assessment, methods for improving memory, organization of memory therapy, selection of appropriate treatments for individual patients, role of the microcomputer in memory rehabilitation, use of drugs in stimulating memory, development of programmes to improve attention and the treatment of the memory-impaired in groups. This second edition has an update on drugs, electronic aids and assessment procedures, with further evidence of the effectiveness of memory therapy. This book would have been an asset for those professionals involved in the rehabilitation of the impaired memory at the time and can still be of value today.
