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Author: Betty Prince
Publisher: John Wiley & Sons
ISBN: 0471986100
Category : Technology & Engineering
Languages : en
Pages : 371
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Book Description
Die Bandbreite und Zugriffszeit traditioneller DRAMs reicht nicht mehr aus, um mit der Geschwindigkeit moderner Mikroprozessoren Schritt zu halten. Daher baut man verstärkt Hochleistungs-Speicherchips, deren neue Generation das Thema dieses Buches bildet. Die Autorin, eine international anerkannte Spezialistin, diskutiert objektiv und herstellerunabhängig Technologien wie DDR DRAMs, CiDDR DRAMs, SL=DRAM, Direct Rambus, SSTL Interfaces und MP-DRAMs. Der aktuellste verfügbare Beitrag zu einem enorm wichtigen Thema! (12/98)
Author: Betty Prince
Publisher: John Wiley & Sons
ISBN: 0471986100
Category : Technology & Engineering
Languages : en
Pages : 371
Get Book Here
Book Description
Die Bandbreite und Zugriffszeit traditioneller DRAMs reicht nicht mehr aus, um mit der Geschwindigkeit moderner Mikroprozessoren Schritt zu halten. Daher baut man verstärkt Hochleistungs-Speicherchips, deren neue Generation das Thema dieses Buches bildet. Die Autorin, eine international anerkannte Spezialistin, diskutiert objektiv und herstellerunabhängig Technologien wie DDR DRAMs, CiDDR DRAMs, SL=DRAM, Direct Rambus, SSTL Interfaces und MP-DRAMs. Der aktuellste verfügbare Beitrag zu einem enorm wichtigen Thema! (12/98)
Author: Texas Instruments Incorporated
Publisher:
ISBN:
Category : Diodes, Schottky-barrier
Languages : en
Pages : 362
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Book Description
Author: Walter A. Triebel
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 420
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Book Description
Author: Stephen R. Schach
Publisher: McGraw-Hill Companies
ISBN:
Category : Computers
Languages : en
Pages : 658
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Book Description
The Universal Modeling Language (UML) has become an industry standard in software engineering. In this text, it is used for object-oriented analysis and design as well as when diagrams depict objects and their interrelationships.
Author: Ashok K. Sharma
Publisher: Wiley-IEEE Press
ISBN: 9780780310001
Category : Technology & Engineering
Languages : en
Pages : 480
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Book Description
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
Author: Kiyoo Itoh
Publisher: Springer Science & Business Media
ISBN: 3662044781
Category : Technology & Engineering
Languages : en
Pages : 504
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Book Description
A systematic description of microelectronic device design. Topics range from the basics to low-power and ultralow-voltage designs, subthreshold current reduction, memory subsystem designs for modern DRAMs, and various on-chip supply-voltage conversion techniques. It also covers process and device issues as well as design issues relating to systems, circuits, devices and processes, such as signal-to-noise and redundancy.
Author:
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 656
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Book Description
Transistors, Triacs, Darlingtons, SCRs. 2N devices. BD, BDW, BDX, BU, BUX, BUY devices. TIC devices. TIP devices. TIPL devices. Appendix.
Author: S. A. Money
Publisher: Academic Press
ISBN: 1483268705
Category : Computers
Languages : en
Pages : 323
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Book Description
Microprocessor Data Book, Second Edition focuses on the available types of microprocessors and microcomputers, including description of internal architecture, instruction set, main electrical data, and package details of these instruments. The book first elaborates on 4-bit and 8-bit microprocessors and microcomputers. Discussions focus on Advanced Micro Devices Am2900 series, Hitachi HMCS40 series, Motorola MC6801 and MC6803, Motorola MC6809 series, Rockwell R6500/1 series, and RCA 1800 series. The text then examines 16-bit and 32-bit microprocessors and microcomputers. Topics include Intel 80286 microprocessor, Motorola 68010, Texas Instruments TMS9980, Zilog Z8000 series, Motorola 68020 processor, and National 32032. The manuscript takes a look at other support devices, peripheral device controllers, and serial I/O devices, including Motorola MC6850 ACIA, Texas Instruments TMS9902 ACC, Thomson EFCIS EF9365/6, and floppy disk controllers. The publication is a valuable source of information for computer science experts and researchers interested in microprocessors and microcomputers.
Author: Souvik Mahapatra
Publisher: Springer
ISBN: 8132225082
Category : Technology & Engineering
Languages : en
Pages : 282
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Book Description
This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characterization techniques for recovery artefact free BTI measurements. It also covers different direct measurements techniques to access pre-existing and newly generated gate insulator traps responsible for BTI. The book provides a consistent physical framework for NBTI and PBTI respectively for p- and n- channel MOSFETs, consisting of trap generation and trapping. A physics-based compact model is presented to estimate measured BTI degradation in planar Si MOSFETs having differently processed SiON and HKMG gate insulators, in planar SiGe MOSFETs and also in Si FinFETs. The contents also include a detailed investigation of the gate insulator process dependence of BTI in differently processed SiON and HKMG MOSFETs. The book then goes on to discuss Reaction-Diffusion (RD) model to estimate generation of new traps for DC and AC NBTI stress and Transient Trap Occupancy Model (TTOM) to estimate charge occupancy of generated traps and their contribution to BTI degradation. Finally, a comprehensive NBTI modeling framework including TTOM enabled RD model and hole trapping to predict time evolution of BTI degradation and recovery during and after DC stress for different stress and recovery biases and temperature, during consecutive arbitrary stress and recovery cycles and during AC stress at different frequency and duty cycle. The contents of this book should prove useful to academia and professionals alike.
Author: Dan Clein
Publisher: Elsevier
ISBN: 0080502113
Category : Technology & Engineering
Languages : en
Pages : 287
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Book Description
This book includes basic methodologies, review of basic electrical rules and how they apply, design rules, IC planning, detailed checklists for design review, specific layout design flows, specialized block design, interconnect design, and also additional information on design limitations due to production requirements.*Practical, hands-on approach to CMOS layout theory and design*Offers engineers and technicians the training materials they need to stay current in circuit design technology.*Covers manufacturing processes and their effect on layout and design decisions
