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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 11
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Book Description
The boundary element method for elastostatics is applied to a thin stability problem arising in solid state surface science. An aim of this work is to determine the morphology of Ge deposited on a Si substrate. Nonstandard boundary conditions at the material interface are used to model the epitaxially grown film. In addition to determining the deformed geometry, it is also necessary to compute the surface stress tensor. Although the surface displacement at the junction between the interface and the Si free surface is not differentiable, the hypersingular integral equation for surface stress can still be used. These techniques are described along with results from 2-D calculations.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 11
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Book Description
The boundary element method for elastostatics is applied to a thin stability problem arising in solid state surface science. An aim of this work is to determine the morphology of Ge deposited on a Si substrate. Nonstandard boundary conditions at the material interface are used to model the epitaxially grown film. In addition to determining the deformed geometry, it is also necessary to compute the surface stress tensor. Although the surface displacement at the junction between the interface and the Si free surface is not differentiable, the hypersingular integral equation for surface stress can still be used. These techniques are described along with results from 2-D calculations.
Author: Matthew Pelliccione
Publisher: Springer Science & Business Media
ISBN: 0387751092
Category : Technology & Engineering
Languages : en
Pages : 206
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Book Description
The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes.
Author: George Richard Daly
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
![Morphological Stability and Failure Mechanisms for Thin Metal and Barrier Films on Porous Low-[kappa] Dielectrics PDF](https://books.google.com/books/content/images/frontcover/u6t-zQEACAAJ?fife=w80-h100)
Author: Ravi Saxena
Publisher:
ISBN: 9780542106897
Category :
Languages : en
Pages : 165
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Book Description
Author: Qipeng Guo
Publisher: John Wiley & Sons
ISBN: 1118452151
Category : Technology & Engineering
Languages : en
Pages : 472
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Book Description
With a focus on structure-property relationships, this book describes how polymer morphology affects properties and how scientists can modify them. The book covers structure development, theory, simulation, and processing; and discusses a broad range of techniques and methods. • Provides an up-to-date, comprehensive introduction to the principles and practices of polymer morphology • Illustrates major structure types, such as semicrystalline morphology, surface-induced polymer crystallization, phase separation, self-assembly, deformation, and surface topography • Covers a variety of polymers, such as homopolymers, block copolymers, polymer thin films, polymer blends, and polymer nanocomposites • Discusses a broad range of advanced and novel techniques and methods, like x-ray diffraction, thermal analysis, and electron microscopy and their applications in the morphology of polymer materials
Author: Wuhua Yang
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 306
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Book Description
Author: S. Kalliadasis
Publisher: Springer Science & Business Media
ISBN: 3211698078
Category : Technology & Engineering
Languages : en
Pages : 211
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Book Description
This book provides a detailed overview and comprehensive analysis of the main theoretical and experimental advances on free surface thin film and jet flows of soft matter. The book outlines the basic equations and boundary conditions and the derivation of low-dimensional models for the evolution of the free surface. At the experimental front, a variety of recent experimental developments is outlined and the link between theory and experiments is illustrated.
Author: R. W. Collins
Publisher:
ISBN:
Category :
Languages : en
Pages : 4
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Book Description
Thin films prepared by vapor deposition methods have a range of applications which demand control over the microstructural, electronic, and/or optical properties. Empirical classification schemes for the morphology of vapor-deposited thin films have been developed over the years in attempts to provide physical insights into the relationships between preparation parameters and resulting film properties. A variety of computational techniques have also been applied to model film growth and to elucidate, the physical principles that account for the observed morphological development. These include continuum, molecular dynamics, Monte Carlo, and ballistic aggregation techniques. In continuum models of film growth, many authors have studied the stability of one-dimensional surface profiles in response to sinusoidal perturbations of wavelength, lambda r. Effects of finite atomic size and shadowing by asperities have been proposed to enhance the perturbations, whereas adatom surface diffusion damps them. A smooth profile can be regained for lambda r lambda o, where lambda o is the adatom diffusion length. When lambda r lambda o, a modulated profile develops that appears analogous to experimentally-observable columnar morphology. In the experimental situation, clustering associated with initial nucleation is the dominant surface perturbation for thin film deposition on dissimilar substrates. It is technologically important to determine and control the evolution of surface morphology with subsequent film growth. Of direct importance here is the ability to fabricate multilayered structures with smooth interfaces.
Author: Milton Ohring
Publisher: Academic Press
ISBN: 0125249756
Category : Science
Languages : en
Pages : 817
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Book Description
This is the first book that can be considered a textbook on thin film science, complete with exercises at the end of each chapter. Ohring has contributed many highly regarded reference books to the AP list, including Reliability and Failure of Electronic Materials and the Engineering Science of Thin Films. The knowledge base is intended for science and engineering students in advanced undergraduate or first-year graduate level courses on thin films and scientists and engineers who are entering or require an overview of the field. Since 1992, when the book was first published, the field of thin films has expanded tremendously, especially with regard to technological applications. The second edition will bring the book up-to-date with regard to these advances. Most chapters have been greatly updated, and several new chapters have been added.
Author: Michael J. Aziz
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 448
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Book Description
"The papers compiled in this volume were presented in Symposium W, 'Morphological and Compositional Evolution of Thin Films, ' held December 2-5 at the 2002 MRS Fall Meeting in Boston Massachusetts. They are organized in the order that they were presented."--P. xiii.
