Modulation Spectroscopy of Semiconductor Microstructures PDF Download
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Author: Wojciech Krystek
Publisher:
ISBN:
Category : Microstructure
Languages : en
Pages : 260
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Book Description
Author: Wojciech Krystek
Publisher:
ISBN:
Category : Microstructure
Languages : en
Pages : 260
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Book Description
Author: Zhijiang Hang
Publisher:
ISBN:
Category : Modulation spectroscopy
Languages : en
Pages : 344
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Book Description
Author: Yichun Yin
Publisher:
ISBN:
Category : Germanium
Languages : en
Pages : 364
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Book Description
Author: Gerhard Fasol
Publisher: Springer Science & Business Media
ISBN: 1475765657
Category : Science
Languages : en
Pages : 661
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Book Description
Proceedings of a NATO ARW held in Venice, Italy, May 9-13, 1989
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 143
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Book Description
Author: Jan Misiewicz
Publisher:
ISBN:
Category :
Languages : en
Pages : 299
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Book Description
Author: Sue-chu Shen
Publisher: World Scientific
ISBN: 9814569682
Category :
Languages : en
Pages : 442
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Book Description
This proceedings volume covers new results from recent studies on impurity states, bound states in semiconductors, phonons, excitons and electron confinement in superlattices and quantum wells, magnetooptics, optical properties of solids in far infrared and millimeter wave regions, optical nonlinearity for III-V, II-VI compounds, Si, Ge, amorphous and organic semiconductors as well as optical crystals. Special emphasis is placed on the 2DEG system.
Author: International Workshop on Modulation Spectroscopy of Semiconductor Structures (MS 3) 2004, Wrocław
Publisher:
ISBN:
Category :
Languages : en
Pages : 143
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Book Description
Author: I. Ohdomari
Publisher: Elsevier
ISBN: 1483290484
Category : Science
Languages : en
Pages : 600
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Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Author:
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 904
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Book Description
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
