Author: E. J. Mittemeijer
Publisher: John Wiley & Sons
ISBN: 3527649905
Category : Science
Languages : en
Pages : 563
Book Description
The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).
Modern Diffraction Methods
Author: E. J. Mittemeijer
Publisher: John Wiley & Sons
ISBN: 3527649905
Category : Science
Languages : en
Pages : 563
Book Description
The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).
Publisher: John Wiley & Sons
ISBN: 3527649905
Category : Science
Languages : en
Pages : 563
Book Description
The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).
X-Ray Diffraction
Author: Oliver H. Seeck
Publisher: CRC Press
ISBN: 9814303607
Category : Science
Languages : en
Pages : 438
Book Description
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Publisher: CRC Press
ISBN: 9814303607
Category : Science
Languages : en
Pages : 438
Book Description
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
X-Ray Diffraction
Author: B. E. Warren
Publisher: Courier Corporation
ISBN: 0486141616
Category : Science
Languages : en
Pages : 402
Book Description
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
Publisher: Courier Corporation
ISBN: 0486141616
Category : Science
Languages : en
Pages : 402
Book Description
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
Powder Diffraction
Author:
Publisher: DIANE Publishing
ISBN: 9781422318324
Category :
Languages : en
Pages : 18
Book Description
Publisher: DIANE Publishing
ISBN: 9781422318324
Category :
Languages : en
Pages : 18
Book Description
Modern Powder Diffraction
Author: David L. Bish
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 1501509012
Category : Science
Languages : en
Pages : 384
Book Description
Volume 20 of Reviews in Mineralogy attempted to: (1) provide examples illustrating the state-of-the-art in powder diffraction, with emphasis on applications to geological materials; (2) describe how to obtain high-quality powder diffraction data; and (3) show how to extract maximum information from available data. In particular, the nonambient experiments are examples of some of the new and exciting areas of study using powder diffraction, and the interested reader is directed to the rapidly growing number of published papers on these subjects. Powder diffraction has evolved to a point where considerable information can be obtained from ug-sized samples, where detection limits are in the hundreds of ppm range, and where useful data can be obtained in milliseconds to microseconds. We hope that the information in this volume will increase the reader's access to the considerable amount of information contained in typical diffraction data.
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 1501509012
Category : Science
Languages : en
Pages : 384
Book Description
Volume 20 of Reviews in Mineralogy attempted to: (1) provide examples illustrating the state-of-the-art in powder diffraction, with emphasis on applications to geological materials; (2) describe how to obtain high-quality powder diffraction data; and (3) show how to extract maximum information from available data. In particular, the nonambient experiments are examples of some of the new and exciting areas of study using powder diffraction, and the interested reader is directed to the rapidly growing number of published papers on these subjects. Powder diffraction has evolved to a point where considerable information can be obtained from ug-sized samples, where detection limits are in the hundreds of ppm range, and where useful data can be obtained in milliseconds to microseconds. We hope that the information in this volume will increase the reader's access to the considerable amount of information contained in typical diffraction data.
Analytical Geomicrobiology
Author: Janice P. L. Kenney
Publisher: Cambridge University Press
ISBN: 1107070333
Category : Nature
Languages : en
Pages : 429
Book Description
A comprehensive handbook outlining state-of-the-art analytical techniques used in geomicrobiology, for advanced students, researchers and professional scientists.
Publisher: Cambridge University Press
ISBN: 1107070333
Category : Nature
Languages : en
Pages : 429
Book Description
A comprehensive handbook outlining state-of-the-art analytical techniques used in geomicrobiology, for advanced students, researchers and professional scientists.
Modern Techniques of Surface Science
Author: D. P. Woodruff
Publisher: Cambridge University Press
ISBN: 9780521424981
Category : Science
Languages : en
Pages : 612
Book Description
Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.
Publisher: Cambridge University Press
ISBN: 9780521424981
Category : Science
Languages : en
Pages : 612
Book Description
Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.
Classical and Modern Diffraction Theory
Author: Kamill Klem-Musatov
Publisher: SEG Books
ISBN: 1560803223
Category : Science
Languages : en
Pages : 341
Book Description
Providing geophysicists with an in-depth understanding of the theoretical and applied background for the seismic diffraction method, “Classical and Modern Diffraction Theory” covers the history and foundations of the classical theory and the key elements of the modern diffraction theory. Chapters include an overview and a historical review of classical theory, a summary of the experimental results illustrating this theory, and key principles of the modern theory of diffraction; the early cornerstones of classical diffraction theory, starting from its inception in the 17th century and an extensive introduction to reprinted works of Grimaldi, Huygens, and Young; details of the classical theory of diffractions as developed in the 19th century and reprinted works of Fresnel, Green, Helmholtz, Kirchhoff, and Rayleigh; and the cornerstones of the modern theory including Keller’s geometrical theory of diffraction, boundary-layer theory, and super-resolution. Appendices on the Cornu spiral and Babinet’s principle are also included.
Publisher: SEG Books
ISBN: 1560803223
Category : Science
Languages : en
Pages : 341
Book Description
Providing geophysicists with an in-depth understanding of the theoretical and applied background for the seismic diffraction method, “Classical and Modern Diffraction Theory” covers the history and foundations of the classical theory and the key elements of the modern diffraction theory. Chapters include an overview and a historical review of classical theory, a summary of the experimental results illustrating this theory, and key principles of the modern theory of diffraction; the early cornerstones of classical diffraction theory, starting from its inception in the 17th century and an extensive introduction to reprinted works of Grimaldi, Huygens, and Young; details of the classical theory of diffractions as developed in the 19th century and reprinted works of Fresnel, Green, Helmholtz, Kirchhoff, and Rayleigh; and the cornerstones of the modern theory including Keller’s geometrical theory of diffraction, boundary-layer theory, and super-resolution. Appendices on the Cornu spiral and Babinet’s principle are also included.
Diffraction Analysis of the Microstructure of Materials
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Materials Characterization
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.