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Author: Severin Amelinckx
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 422
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Book Description
Author: Severin Amelinckx
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 422
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Book Description
Author: Herbert Herman
Publisher: Elsevier
ISBN: 1483218139
Category : Technology & Engineering
Languages : en
Pages : 337
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Book Description
Treatise on Materials Science and Technology, Volume 4 covers the fundamental properties and characterization of materials, ranging from simple solids to complex heterophase systems. The book covers articles on advanced techniques by which thin films may be characterized; on diffusion in substitutional alloys; and on solid solution strengthening in face-centered cubic alloys. The text also includes articles on the thermodynamics of binary ordered intermetallic phases; and the major aspects of metal powder processing. Professional scientists and engineers, as well as graduate students in materials science and associated fields will find the book invaluable.
Author: Brent Fultz
Publisher: Springer Science & Business Media
ISBN: 3642297609
Category : Science
Languages : en
Pages : 775
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Book Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author: Francisco E. Fujita
Publisher: Springer Science & Business Media
ISBN: 3662004615
Category : Science
Languages : en
Pages : 317
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Book Description
Physics of New Materials starts from basic science, specially solid-state physics, and then moves into the research and development of advanced materials. The emphasis of the discussions is concentrated on the electronicand atomic structures and properties of transition-metal systems, liquidand amorphous materials, the nano-phase materials, layered compounds, martensite and other structural-transformed materials, and ordered alloys. Though these discussions, the physical aspects and principles ofnew materials, such as strong ferromagnetic alloys, shape memory alloys, amorphous alloys, ultra-fine particles, intercalated layered compounds, deformable ceramics, and nuclear-physics techniques. In addition to these theoretical treatments, modern experimental techniques, exemplified by M|ssbauer spectroscopy and electron microscopy, demonstrate the vast scope of schemes needed in the development of new materials.
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: P.E. Champness
Publisher: Springer Science & Business Media
ISBN: 3642661963
Category : Science
Languages : en
Pages : 574
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Book Description
During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Author: Martin Berz
Publisher: CRC Press
ISBN: 9780750308083
Category : Science
Languages : en
Pages : 624
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Book Description
The field of beam physics touches many areas of physics, engineering, and the sciences. In general terms, beams describe ensembles of particles with initial conditions similar enough to be treated together as a group so that the motion is a weakly nonlinear perturbation of a chosen reference particle. Particle beams are used in a variety of areas, ranging from electron microscopes, particle spectrometers, medical radiation facilities, powerful light sources, and astrophysics to large synchrotrons and storage rings such as the LHC at CERN. An Introduction to Beam Physics is based on lectures given at Michigan State University’s Department of Physics and Astronomy, the online VUBeam program, the U.S. Particle Accelerator School, the CERN Academic Training Programme, and various other venues. It is accessible to beginning graduate and upper-division undergraduate students in physics, mathematics, and engineering. The book begins with a historical overview of methods for generating and accelerating beams, highlighting important advances through the eyes of their developers using their original drawings. The book then presents concepts of linear beam optics, transfer matrices, the general equations of motion, and the main techniques used for single- and multi-pass systems. Some advanced nonlinear topics, including the computation of aberrations and a study of resonances, round out the presentation.
Author: Marc De Graef
Publisher: Cambridge University Press
ISBN: 0521620066
Category : Science
Languages : en
Pages : 741
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Book Description
A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Author: Ralf Vanselow
Publisher: Springer Science & Business Media
ISBN: 3642757626
Category : Technology & Engineering
Languages : en
Pages : 471
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Book Description
This volume contains review articles written by the invited speakers at the ninth International Summer Institute in Surface Science (ISISS 1989), held at the Uni versity of Wisconsin-Milwaukee in August of 1989. During the course of ISISS, invited speakers, all internationally recognized experts in the various fields of surface science, present tutorial review lectures. In addition, these experts are asked to write review articles on their lecture topic. Former ISISS speakers serve as advisors concerning the selection of speakers and lecture topics. Emphasis is given to those areas which have not been covered in depth by recent Summer Institutes, as well as to areas which have recently gained in significance and in which important progress has been made. Because of space limitations, no individual volume of Chemistry and Physics of Solid Surfaces can possibly cover the whole area of modern surface science, or even give a complete survey of recent progress in this field. However, an attempt is made to present a balanced overview in the series as a whole. With its comprehensive literature references and extensive subject indices, this series has become a valuable resource for experts and students alike. The collected articles, which stress particularly the gas-solid interface, have been published under the following titles: Surface Science: Recent Progress and Perspectives, Crit. Rev. Solid State Sci.
Author: Philip F. Kane
Publisher: Springer Science & Business Media
ISBN: 1461344905
Category : Technology & Engineering
Languages : en
Pages : 675
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Book Description
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
