Models, Measurement, and Metrology Extending the Si PDF Download
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Author: William P Fisher Jr
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3111036499
Category : Technology & Engineering
Languages : en
Pages : 522
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Book Description
The book focuses on the extension of quality-assured measurement and metrology into psychological and social domains. This is not only feasible and achievable, but also a pressing concern. Significant progress in developing a common conceptual system for measurement across the sciences has been made in recent collaborations between metrologists and psychometricians, as reported in the chapters of this book. Modeling, estimation, and interpretation of objectively reproducible unit quantities that support both general comparability and adaptation to unique local circumstances are demonstrated in fields as diverse as artificial intelligence, justice, and beauty perception.
Author: William P Fisher Jr
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3111036499
Category : Technology & Engineering
Languages : en
Pages : 522
Get Book Here
Book Description
The book focuses on the extension of quality-assured measurement and metrology into psychological and social domains. This is not only feasible and achievable, but also a pressing concern. Significant progress in developing a common conceptual system for measurement across the sciences has been made in recent collaborations between metrologists and psychometricians, as reported in the chapters of this book. Modeling, estimation, and interpretation of objectively reproducible unit quantities that support both general comparability and adaptation to unique local circumstances are demonstrated in fields as diverse as artificial intelligence, justice, and beauty perception.
Author: William P Fisher Jr
Publisher: Walter de Gruyter
ISBN: 9783111036236
Category :
Languages : en
Pages : 0
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Book Description
Author: William P. Fisher Jr., Leslie Pendrill
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3111037150
Category :
Languages : en
Pages : 389
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Book Description
Author: Numan M. Durakbasa
Publisher: Springer Nature
ISBN: 3031539915
Category :
Languages : en
Pages : 847
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Book Description
Author: S. V. Gupta
Publisher: Springer
ISBN: 9783030439712
Category : Technology & Engineering
Languages : en
Pages : 304
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Book Description
This book delivers a comprehensive overview of units of measurement. Beginning with a historical look at metrology in Ancient India, the book explains fundamental concepts in metrology such as basic, derived and dimensionless quantities, and introduces the concept of quantity calculus. It discusses and critically examines various three and four-dimensional systems of units used both presently and in the past, while explaining why only four base units are needed for a system of measurement. It discusses the Metre Convention as well as the creation of the International Bureau of Weights and Measures, and gives a detailed look at the evolution of the current SI base units of time, length, mass, electric current, temperature, intensity of illumination and substance. This updated second edition is extended with timely new chapters discussing past efforts to redefine the SI base units as well as the most recent 2019 redefinitions based entirely on the speed of light and other fundamental physical constants. Additionally, it provides biographical presentations of many of the historical figures behind commonly used units of measurements, such as Newton, Joule and Ohm, With its accessible and comprehensive treatment of the field, together with its unique presentation of the underlying history, this book is well suited to any student and researcher interested in the practical and historical aspects of the field of metrology.
Author: Agnes Kaposi
Publisher: Springer
ISBN:
Category : Computers
Languages : en
Pages : 364
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Book Description
Systems, Models and Measures seeks to bridge the gap between the 'classical' and the newer technologies by constructing a systematic measurement framework for both. The authors use their experience as consultants in systems, software and quality engineering to take the subject from concept and theory, via strategy and procedure, to tools and applications. The book clarifies the key notions of system, model, measurement, product, process, specification and design. Practical examples demonstrate the 'architecture' of measurement schemes, extending them to object-oriented and subjective measurement. A detailed case study provides a measurement strategy for formal specifications, including Prolog, Z and VDM. The reader will be able to formulate problems in measurable terms, appraise and compare formal specifications, assess and enhance existing measurement practices, and devise measurement schemes for describing objective characteristics and expressing value judgements.
Author: Dieter K. Schroder
Publisher: The Electrochemical Society
ISBN: 1566775698
Category : Semiconductors
Languages : en
Pages : 406
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Book Description
Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.
Author:
Publisher:
ISBN:
Category : Measurement
Languages : en
Pages : 548
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Book Description
Author: Electrochemical Society
Publisher:
ISBN:
Category : Electrochemistry
Languages : en
Pages : 1150
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Book Description
Author: David G. Seiler
Publisher: American Institute of Physics
ISBN:
Category : Computers
Languages : en
Pages : 714
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Book Description
The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise.
