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Author: V. Randle
Publisher:
ISBN: 9781003423980
Category :
Languages : en
Pages : 0
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Book Description
A cornerstone in the study of both natural and technological materials is characterisation of microstructure. In the widest sense this topic encompasses, for all phases present: morphology, including size and shape distributions; chemical composition; crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. A definition of microtexture is: 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure.' The term microtexture also describes any experimental technique used to determine this information. Essentially, a stationary beam of electrons is diffracted by atomic planes in the sampled volume of specimen. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95 percent of microtexture determination is by 'electron backscatter diffraction' (EBSD) in a scanning electron microscope (SEM), with the remaining 5 percent contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these changes.
Author: V. Randle
Publisher:
ISBN: 9781003423980
Category :
Languages : en
Pages : 0
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Book Description
A cornerstone in the study of both natural and technological materials is characterisation of microstructure. In the widest sense this topic encompasses, for all phases present: morphology, including size and shape distributions; chemical composition; crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. A definition of microtexture is: 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure.' The term microtexture also describes any experimental technique used to determine this information. Essentially, a stationary beam of electrons is diffracted by atomic planes in the sampled volume of specimen. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95 percent of microtexture determination is by 'electron backscatter diffraction' (EBSD) in a scanning electron microscope (SEM), with the remaining 5 percent contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these changes.
Author: V. Randle
Publisher: CRC Press
ISBN: 1000944034
Category : Technology & Engineering
Languages : en
Pages : 147
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Book Description
A cornerstone in the study of both natural and technological materials is characterisation of microstructure. In the widest sense this topic encompasses, for all phases present: morphology, including size and shape distributions; chemical composition; crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. A definition of microtexture is: 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure.' The term microtexture also describes any experimental technique used to determine this information. Essentially, a stationary beam of electrons is diffracted by atomic planes in the sampled volume of specimen. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95 percent of microtexture determination is by 'electron backscatter diffraction' (EBSD) in a scanning electron microscope (SEM), with the remaining 5 percent contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these changes.
Author: Valerie Randle
Publisher: Matsci
ISBN:
Category : Science
Languages : en
Pages : 156
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Book Description
The characterisation of microstructure is a cornerstone in the study of both natural and technological materials. In the widest sense this topic encompasses for all phases present: morphology, including size and shape distributions; chemical composition; and crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. Microtexture can be defined as 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure'. The term microtexture can also be applied to any experimental technique used to determine this information. Essentially, atomic planes in the sampled volume of specimen diffract a stationary beam of electrons. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95% of microtexture determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these developments.
Author: A. D. Rollett
Publisher: John Wiley & Sons
ISBN: 0470444207
Category : Technology & Engineering
Languages : en
Pages : 838
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Book Description
This volume contains papers presented at The 15th International Conference on the Texture of Materials from June 1-5th, 2008 in Pittsburgh, PA. Chapters include: Thin Films Texture at Non-Ambient Conditions Novel Texture Measurement Techniques Including 3D Complex Oxides Interface Textures Recrystallization Texture Biomaterials Texture Effects on Damage Accumulation Digital Microstructures View information on Materials Processing and Texture: Ceramic Transactions, Volume 200.
Author: Gregory S. Chirikjian
Publisher: CRC Press
ISBN: 1420041762
Category : Computers
Languages : en
Pages : 698
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Book Description
The classical Fourier transform is one of the most widely used mathematical tools in engineering. However, few engineers know that extensions of harmonic analysis to functions on groups holds great potential for solving problems in robotics, image analysis, mechanics, and other areas. For those that may be aware of its potential value, there is sti
Author: Olaf Engler
Publisher: CRC Press
ISBN: 1420063669
Category : Science
Languages : en
Pages : 490
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Book Description
The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, pra
Author: Valerie Randle
Publisher: CRC Press
ISBN: 9789056992248
Category : Technology & Engineering
Languages : en
Pages : 412
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Book Description
Encompassing the concepts, practice, and application of orientation analysis, Introduction to Texture Analysis is an essential reference source for reserachers in textiles. The author uses an accessible style to share her expertise, providing comprehensive coverage of the theory and practice of the texture techniques now available and discusses their applications in research and industry. The text considers the merits of each technique for specific applications. Case studies expand upon the author's explanations and help illustrate the main principles involved. Topics include applications of diffraction, SEM- and TEM-based techniques, and crystallographic analyses.
Author: A. D. Rollett
Publisher: John Wiley & Sons
ISBN: 0470444185
Category : Technology & Engineering
Languages : en
Pages : 850
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Book Description
This volume contains papers presented at The 15th International Conference on the Texture of Materials from June 1-5th, 2008 in Pittsburgh, PA. Chapters include: Friction Stir Welding and Processing Texture and Anisotropy in Steels Effects of Magnetic Fields Hexagonal Metals Texture in Materials Design View information on Applications of Texture Analysis: Ceramic Transactions, Volume 201.
Author:
Publisher: Academic Press
ISBN: 0080569137
Category : Technology & Engineering
Languages : en
Pages : 469
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. An important feature of these Advances is that the subjects are written in such a way that they can be understood by readers from other specialities.
Author: Gregory S. Chirikjian
Publisher: Courier Dover Publications
ISBN: 0486795640
Category : Mathematics
Languages : en
Pages : 881
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Book Description
Although the Fourier transform is among engineering's most widely used mathematical tools, few engineers realize that the extension of harmonic analysis to functions on groups holds great potential for solving problems in robotics, image analysis, mechanics, and other areas. This self-contained approach, geared toward readers with a standard background in engineering mathematics, explores the widest possible range of applications to fields such as robotics, mechanics, tomography, sensor calibration, estimation and control, liquid crystal analysis, and conformational statistics of macromolecules. Harmonic analysis is explored in terms of particular Lie groups, and the text deals with only a limited number of proofs, focusing instead on specific applications and fundamental mathematical results. Forming a bridge between pure mathematics and the challenges of modern engineering, this updated and expanded volume offers a concrete, accessible treatment that places the general theory in the context of specific groups.
