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Author: Sabu Thomas
Publisher: Elsevier
ISBN: 0323461476
Category : Technology & Engineering
Languages : en
Pages : 432
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Book Description
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each
Author: Sabu Thomas
Publisher: Elsevier
ISBN: 0323461476
Category : Technology & Engineering
Languages : en
Pages : 432
Get Book
Book Description
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each
Author: Osvaldo de Oliveira, Jr
Publisher: William Andrew
ISBN: 0323497799
Category : Technology & Engineering
Languages : en
Pages : 222
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Book Description
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered Serves as an important, go-to reference for materials scientists and engineers
Author: Weilie Zhou
Publisher: Springer Science & Business Media
ISBN: 0387396209
Category : Technology & Engineering
Languages : en
Pages : 533
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Book Description
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Author: Challa S.S.R. Kumar
Publisher: Springer Science & Business Media
ISBN: 3642389341
Category : Science
Languages : en
Pages : 717
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Book Description
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Author: Challa S.S.R. Kumar
Publisher: Springer
ISBN: 3662527804
Category : Technology & Engineering
Languages : en
Pages : 566
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Book Description
Sixth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Magnetic Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Author: Challa S.S.R. Kumar
Publisher: Springer
ISBN: 3662563223
Category : Technology & Engineering
Languages : en
Pages : 452
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Book Description
Seventh volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about In-situ Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Author: Sabu Thomas
Publisher: Elsevier
ISBN: 0323461468
Category : Technology & Engineering
Languages : en
Pages : 444
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Book Description
Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs). This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing. Explores how spectroscopy and X-ray-based nanocharacterization techniques are applied in modern industry Analyzes all the major spectroscopy and X-ray-based nanocharacterization techniques, allowing the reader to choose the best for their situation Presents a method-orientated approach that explains how to successfully use each technique
Author: Khan Maaz
Publisher: BoD – Books on Demand
ISBN: 9535121502
Category : Science
Languages : en
Pages : 362
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Book Description
This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.
Author: Ratna Tantra
Publisher: John Wiley & Sons
ISBN: 1118753593
Category : Science
Languages : en
Pages : 324
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Book Description
Nanomaterial Characterization Providing various properties of nanomaterials and the various methods available for their characterization Over the course of the last few decades, research activity on nanomaterials has gained considerable press coverage. The use of nanomaterials has meant that consumer products can be made lighter, stronger, esthetically more pleasing, and less expensive. The significant role of nanomaterials in improving the quality of life is clear, resulting in faster computers, cleaner energy production, target-driven pharmaceuticals, and better construction materials. It is not surprising, therefore, that nanomaterial research has really taken off, spanning across different scientific disciplines from material science to nanotoxicology. A critical part of any nanomaterial research, however, is the need to characterize physicochemical properties of the nanomaterials, which is not a trivial matter. Nanomaterial Characterization: An Introduction is dedicated to understanding the key physicochemical properties and their characterization methods. Each chapter begins by giving an overview of the topic before a case study is presented. The purpose of the case study is to demonstrate how the reader may make use of the background information presented to them and show how this can be translated to solve a nanospecific application scenario. Thus, it will be useful for researchers in helping them design experimental investigations. The book begins with a general overview of the subject, thus giving the reader a solid foundation to nanomaterial characterization. Nanomaterial Characterization: An Introduction features: Nanomaterial synthesis and reference nananomaterials Key physicochemical properties and their measurements including particle size distribution by number, solubility, surface area, surface chemistry, mechanical/tribological properties, and dustiness Scanning tunneling microscopy methods operated under extreme conditions Novel strategy for biological characterization of nanomaterial methods Methods to handle and visualize multidimensional nanomaterial characterization data The book is written in such a way that both students and experts in other fields of science will find the information useful, whether they are in academia, industry, or regulation, or those whose analytical background may be limited.There is also an extensive list of references associated with every chapter to encourage further reading.
Author: Surender Kumar Sharma
Publisher: Springer
ISBN: 3319929550
Category : Technology & Engineering
Languages : en
Pages : 613
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Book Description
This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
