Microelectronic Manufacturing Yield, Reliability, and Failure Analysis PDF Download
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Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 218
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Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 218
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Book Description
Author: Hans-Dieter Hartmann
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819426482
Category : Technology & Engineering
Languages : en
Pages : 0
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Ali Keshavarzi
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819422729
Category : Integrated circuits
Languages : en
Pages : 372
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Book Description
Author: Sharad Prasad
Publisher: Society of Photo Optical
ISBN: 9780819429698
Category : Technology & Engineering
Languages : en
Pages : 240
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Book Description
A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 266
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Book Description
Author: A. Christou
Publisher: RIAC
ISBN: 1933904151
Category : Microelectronics
Languages : en
Pages : 410
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Book Description
Author: Gudrun Kissinger
Publisher: Society of Photo Optical
ISBN: 9780819441072
Category : Technology & Engineering
Languages : en
Pages : 242
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Way Kuo
Publisher: Springer Science & Business Media
ISBN: 1461556716
Category : Technology & Engineering
Languages : en
Pages : 407
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Book Description
The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.
