Microcircuit Screening Effectiveness PDF Download
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Author: Henry C. Rickers
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 120
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Book Description
This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).
Author: Henry C. Rickers
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 120
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Book Description
This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).
Author: G. M. Johnson
Publisher:
ISBN:
Category :
Languages : en
Pages : 318
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Book Description
The results of an extensive life test matrix demonstrated the general validity and effectiveness of accelerated tests of microcircuits using both temperature and voltage as accelerating stresses. Over 2500 microcircuits from TTL, CMOS and linear technologies were life tested at ambient temperatures between 125C and 285C. In general, bimodal failure distributions, comprised of early (Freak) and late (main) lognormal distributions, were observed. The relationship of median life with junction temperature could be represented with an Arrehenius reaction rate model. Activation energies for the freak distribution ranged from 0.7 eV to 1.3 eV, and in certain instances a short high temperature burn-in to eliminate the freak population results in a dramatic improvement in use-temperature failure rates. Complete high temperature microcircuit life characterization and lot acceptance tests are required to identify economically screenable lots. MIL-STD-883 test methods are proposed for general application of microcircuit high temperature accelerated tests as a new tool for assuring the reliability of semiconductor production lots, and for screening out potential surface related failures. Included in the proposed methods are guidelines for assuring test effectiveness. The inherent effectiveness of accelerated tests can only be assured through careful selection of the life-test circuit configuration, and test temperatures, and the effective analysis of the resulting failure data.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 412
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Book Description
Author: H. F. Dean
Publisher:
ISBN:
Category :
Languages : en
Pages : 72
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Book Description
The effectiveness of thermal infrared mapping and nondestructive electrical tests for reliability screening was tested on 100 specimens of an industrial grade digital-type microcircuit. It was shown that more effective screening tests are needed, as a number of early failures were not predictable by the test methods employed. It was also shown that microcircuit containers may be opened for inspection and testing without degrading their reliability. (Author).
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 436
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Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 312
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Book Description
Author: A.A. Lakner
Publisher: CRC Press
ISBN: 1351358103
Category : Technology & Engineering
Languages : en
Pages : 465
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Book Description
First Published in 2017. This book presents a much needed practical methodology for the establishment of cost-effective reliability programs in nuclear or other high technology industries. Thanks to the high competence and practical experience of the authors in the field of reliability, it vividly illustrates the applicability of proven, cost-effective reliability techniques applied in the American space and military programs as hybridized with the avant-garde approach used by nuclear authorities, utilities and researchers in the United Kingdom and France. This emerged method will support a diligent effort in the enhancement of nuclear safety and protection of the health of the general public. The methodology developed in this book exemplifies the total integrated reliability program approach in the design, procurement, manufacturing, test, installation and operational phases of an equipment life cycle. It is based on lessons learned in space and military programs with certain methodological modifications to enhance practicality. The techniques described here are applicable to college instruction, plant upper and middle management personnel, as well as to regulating agencies with equal benefits; it provides a very pragmatic and cost-efficient approach to the reliability engineering discipline
Author: Robert G. Arno
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 276
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Book Description
This report, organized in four major sections, presents reliability information based on field operation, dormant state and test data for more than 250 major nonelectronic part types. The four sections are Generic Data, Detailed Data, Application Data, and failure Modes and Mechanisms. Each device type contains reliability information in relation to the specific operational environments. (Author).
Author: Norman. B. Fuqua
Publisher: CRC Press
ISBN: 1000146782
Category : Technology & Engineering
Languages : en
Pages : 409
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Book Description
This book addresses the needs of electronic design engineers, reliability engineers, and their respective managers, stressing a pragmatic viewpoint rather than a vigorous mathematical presentation.
Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 812
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Book Description
