Microcircuit Device Reliability. Digital Evaluation and Generic Failure Analysis Data PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Microcircuit Device Reliability. Digital Evaluation and Generic Failure Analysis Data PDF full book. Access full book title Microcircuit Device Reliability. Digital Evaluation and Generic Failure Analysis Data by David B. Nicholls. Download full books in PDF and EPUB format.
Author: David B. Nicholls
Publisher:
ISBN:
Category :
Languages : en
Pages : 354
Get Book Here
Book Description
This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
Author: David B. Nicholls
Publisher:
ISBN:
Category :
Languages : en
Pages : 354
Get Book Here
Book Description
This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
Author: David B. Nicholls
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 344
Get Book Here
Book Description
Author: David B. Nicholls
Publisher:
ISBN:
Category : Digital integrated circuits
Languages : en
Pages : 352
Get Book Here
Book Description
Author: David B. Nicholls
Publisher:
ISBN:
Category : Digital electronics
Languages : en
Pages :
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 436
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 765
Get Book Here
Book Description
This compendium of digital SSI/MSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental/ screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.
Author: David B. Nicholls
Publisher:
ISBN:
Category :
Languages : en
Pages : 328
Get Book Here
Book Description
Author: Kieron A. Dey
Publisher:
ISBN:
Category : Computer storage devices
Languages : en
Pages : 462
Get Book Here
Book Description
This book contains data on memory and digital LSI device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparison of predicted with observed failure rates is given, predictions being carried out to MIL-HDBK-217C. This book includes a new section on failure analysis results not included in previous editions. (Author).
Author: Roy C. Walker
Publisher:
ISBN:
Category : Digital integrated circuits
Languages : en
Pages : 260
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1048
Get Book Here
Book Description
