Introduction to Statistics in Metrology PDF Download
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Author: Stephen Crowder
Publisher: Springer Nature
ISBN: 3030533298
Category : Mathematics
Languages : en
Pages : 357
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Book Description
This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
Author: Stephen Crowder
Publisher: Springer Nature
ISBN: 3030533298
Category : Mathematics
Languages : en
Pages : 357
Get Book Here
Book Description
This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
Author: Franco Pavese
Publisher: Springer Science & Business Media
ISBN: 0817648046
Category : Mathematics
Languages : en
Pages : 499
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Book Description
This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.
Author: Mario Caria
Publisher: World Scientific
ISBN: 191129895X
Category : Mathematics
Languages : en
Pages : 239
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Book Description
This book deals with the statistical treatment of experimental data. It is also meant for those who are entirely new to the field of statistics and probability calculus, and those who wish to obtain rigorous estimates of the uncertainties associated with the experimental results of any discipline, such as meteorology, engineering, physics, chemistry and the life sciences. To understand the text, only a basic understanding of differential calculus is required.As an innovative teaching approach, simple laboratory class experiments are used as the basis for developing a detailed statistical analysis. This is done by directly using the students' logbooks without re-elaboration. The approach is profitable and can be easily pursued by the layman.People have, in the past, been confused by the many statistical definitions, formulae and assumptions. This book tries to avoid any arbitrary definition by using the recently introduced ISO directives.All the concepts, parameters and test variables for the modern treatment of experimental data are included. Among them are the error, uncertainty and its estimate, the distribution functions and the associated parameters. Every concept is associated with a simple experimental situation and the data analysis is performed in numerical detail. For completeness, the correlation of uncertainties with the error matrix is dealt with in greater detail. All the tests of hypotheses are presented. They are introduced from simple arguments and developed up to the analytical details. The applications of the tests to the fitting of experimental curves of the χ2, t and F tests, as well as the one most often used in the life sciences, the ANOVA, are shown./a
Author: Sarah Boslaugh
Publisher: "O'Reilly Media, Inc."
ISBN: 1449316824
Category : Computers
Languages : en
Pages : 595
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Book Description
A clear and concise introduction and reference for anyone new to the subject of statistics.
Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 888
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Book Description
Author: Ted Vosk
Publisher: CRC Press
ISBN: 143982620X
Category : Law
Languages : en
Pages : 457
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Book Description
Forensic metrology is the application of scientific measurement to the investigation and prosecution of crime. Forensic measurements are relied upon to determine breath and blood alcohol and drug concentrations, weigh seized drugs, perform accident reconstruction, and for many other applications. Forensic metrology provides a basic framework for th
Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 20
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Book Description
Author: Harry H. Ku
Publisher:
ISBN:
Category : Mathematical statistics
Languages : en
Pages : 52
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Book Description
Author: Semyon G. Rabinovich
Publisher: Springer Science & Business Media
ISBN: 1441914560
Category : Technology & Engineering
Languages : en
Pages : 278
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Book Description
"Evaluating Measurement Accuracy" is intended for anyone who is concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: meteorologists, engineers and experimental scientists who use measurements as tools in their professions, graduate and undergraduate students in the natural sciences and engineering, and technicians performing complex measurements in industry, quality control, and trade. The material of the book is presented from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This inclusion is a notable and unique aspect of this title as complex measurements done in industry and trade are often neglected in metrological literature, leaving the practitioners of these measurements to devise their own ad-hoc techniques.
Author: Rajpal S. Sirohi
Publisher: CRC Press
ISBN: 1351831119
Category : Technology & Engineering
Languages : en
Pages : 353
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Book Description
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
