Measurement Electronics of Industrial Microwave Resonator Sensors PDF Download
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Author: Pertti V. Vainikainen
Publisher:
ISBN: 9789512207220
Category : Microwave detectors
Languages : en
Pages : 29
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Book Description
Author: Pertti V. Vainikainen
Publisher:
ISBN: 9789512207220
Category : Microwave detectors
Languages : en
Pages : 29
Get Book Here
Book Description
Author: Pertti V. Vainikainen
Publisher:
ISBN:
Category :
Languages : en
Pages : 29
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Book Description
Author: Ebbe Nyfors
Publisher: Artech House Microwave Library
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
Textbook designed for an advanced undergraduate course in industrial applications of microwaves. Provides knowledge about the possibilities of the microwave technique in implementing practical measurement sensors. Knowledge of the fundamentals of physics and electronics is assumed. Annotation copyri
Author: Pertti Vainikainen
Publisher:
ISBN: 9789512207213
Category : Microwave detectors
Languages : en
Pages : 41
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Book Description
Author: L. F. Chen
Publisher: John Wiley & Sons
ISBN: 0470020458
Category : Technology & Engineering
Languages : en
Pages : 552
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Book Description
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book: Provides a comprehensive introduction to microwave theory and microwave measurement techniques. Examines every aspect of microwave material properties, circuit design and applications. Presents materials property characterisation methods along with a discussion of the underlying theory. Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications. Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences. This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 372
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Book Description
Author:
Publisher:
ISBN: 1785611402
Category :
Languages : en
Pages :
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Book Description
Author: Klaus Kupfer
Publisher: Springer Science & Business Media
ISBN: 3540264914
Category : Technology & Engineering
Languages : en
Pages : 546
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Book Description
Mformation about a material can be gathered from its interaction with electromagnetic waves. The information may be stored in the amplitude, the phase, the polarisation, the angular distribution of energy transportation or the spectral characteristics. When re trieved from the wave, certain material properties may thus be determined indirectly. Compared on the one hand to direct material analysis, an indirect method requires calibration and is prone to interference from undesired sources. On the other hand, however, it permits the determination of features inaccessible by direct methods, such as non-destructive material interrogation, high measurement speed, or deep penetration depth. However, being a physical method, the use of electromagnetic waves is still handicapped by the lack of acceptance by many chemists, who are used to applying direct approaches. Historically, the first application of electromagnetic wave interaction with mat ter involved measurement of amplitude changes at a single frequency caused by material properties, and it is still used today by some systems. This approach was soon supplemented by single frequency phase measurements, in order to avoid distortions through amplitude instabilities or parasitic reflections. Such single pa rameter measurements of course require dependence only on one variable in the measured process and sufficient stability of all other ancillary conditions. If that is not the case, the single parameter measurement fails.
Author: Ebbe Nyfors
Publisher: Artech House Microwave Library
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 436
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Book Description
Textbook designed for an advanced undergraduate course in industrial applications of microwaves. Provides knowledge about the possibilities of the microwave technique in implementing practical measurement sensors. Knowledge of the fundamentals of physics and electronics is assumed. Annotation copyri
Author: Library of Congress
Publisher:
ISBN:
Category : Subject headings, Library of Congress
Languages : en
Pages : 1492
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Book Description
