Measurement and Interpretation of Transient Electronic Phenomena in Cadmium Sulfide

Measurement and Interpretation of Transient Electronic Phenomena in Cadmium Sulfide PDF Author: Richard Anton Greiner
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ISBN:
Category : Cadmium sulfide photoconductive cells
Languages : en
Pages : 214

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Measurement and Interpretation of Transient Electronic Phenomena in Cadmium Sulfide

Measurement and Interpretation of Transient Electronic Phenomena in Cadmium Sulfide PDF Author: Richard Anton Greiner
Publisher:
ISBN:
Category : Cadmium sulfide photoconductive cells
Languages : en
Pages : 214

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An Investigation of Transient Negative Resistance in a Cadmium Sulfide Device

An Investigation of Transient Negative Resistance in a Cadmium Sulfide Device PDF Author: John Irvin Giem
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ISBN:
Category : Cadmium sulfide photoconductive cells
Languages : en
Pages : 60

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"An analysis has been made of a CdS device which exhibits a transient negative resistance at room temperature and low field strengths whereas previously reported cases of negative resistance in CdS were observed at low temperatures and moderate to high electric fields. The CdS bar was illuminated on one end in the vicinity of an ohmic In contact. Contact was made to the other end of the device with a rectifying Ag contact and the device was reverse biased. Experimental evidence and the analytical results both indicated that it is necessary that the material used to make the negative resistance devices must have a relatively low carrier mobility, high trap density, and a low regeneration rate for trapped carriers. As the light induced carriers reach the rectifying contact and raise the carrier concentration, the voltage across the contact decreases due to the dependence of the voltage on carrier concentration. This induces a transient negative resistance if the transit time of carriers from the illuminated section of the crystal is relatively long"--Abstract, leaf ii.

Subject Catalog

Subject Catalog PDF Author: Library of Congress
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ISBN:
Category : Catalogs, Subject
Languages : en
Pages : 656

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Library of Congress Catalog

Library of Congress Catalog PDF Author: Library of Congress
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ISBN:
Category : Catalogs, Subject
Languages : en
Pages : 656

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A cumulative list of works represented by Library of Congress printed cards.

Comprehensive Dissertation Index

Comprehensive Dissertation Index PDF Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 892

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Dissertation Abstracts

Dissertation Abstracts PDF Author:
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Category : Dissertations, Academic
Languages : en
Pages : 1478

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Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports PDF Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 1134

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Library of Congress Catalogs

Library of Congress Catalogs PDF Author: Library of Congress
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Category :
Languages : en
Pages : 658

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Contact Properties and Related Conduction Phenomena in Insulating Cadmium Sulfide

Contact Properties and Related Conduction Phenomena in Insulating Cadmium Sulfide PDF Author: Eric Léon Anne Courtens
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ISBN:
Category : Cadmium sulfide
Languages : en
Pages : 195

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The static distribution of the electric field in thin insulating crystals of DcS provided with various electrodes was investigated. It was found that, when non-injecting electrodes were used, contact barriers were formed which have the nature of the usual Schottky barriers known to exist on high-conductivity CdS. The square of the barrier thickness is linear in the applied voltage, and the barrier potential is related to the metal work-function, the electron affinity of CdS, and the Fermi level depth, as predicted by the simplest contact theory, without having to resort to surface states. The barrier thickness, which for insulators cannot be measured by any of the standard semiconductor procedures, was derived from the measurement of a fast-pulse photoeffect. A pulse photoeffect model was developed that successfully explains the results in terms of contact barriers. The barrier space-charge density can be related to the bulk density of centers. The barrier photoeffect model in CdS is dependent on the presence of native defects of relatively high density and electron cross-section. The properties of these centers are in agreement with previous reports. Slow sensitizing centers were also investigated, and their cross-section is in good agreement with previously-reported values. The results indicate how to prepare contacts that approach the flat band condition. This is shown to be important for accurate resistivity measurements on thin crystals. (Author).

Comprehensive Dissertation Index, 1861-1972: Engineering: civil, electrical, and industrial

Comprehensive Dissertation Index, 1861-1972: Engineering: civil, electrical, and industrial PDF Author: Xerox University Microfilms
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 874

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