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Author: Daisuke Shindo
Publisher: John Wiley & Sons
ISBN: 3527829709
Category : Technology & Engineering
Languages : en
Pages : 244
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Book Description
Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.
Author: Daisuke Shindo
Publisher: John Wiley & Sons
ISBN: 3527829709
Category : Technology & Engineering
Languages : en
Pages : 244
Get Book Here
Book Description
Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.
Author: Daisuke Shindo
Publisher: John Wiley & Sons
ISBN: 3527348042
Category : Technology & Engineering
Languages : en
Pages : 244
Get Book Here
Book Description
Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.
Author: Edgar Völkl
Publisher: Springer Science & Business Media
ISBN: 9780306449208
Category : Science
Languages : en
Pages : 378
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Book Description
This text offers experienced and novice holographers a solid foundation in the theory and practice of holography, the next generation of imaging technology. The guide's how to aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A useful bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences complete the study.
Author: DAISUKE Shindo
Publisher: Springer Science & Business Media
ISBN: 4431669884
Category : Science
Languages : en
Pages : 162
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Book Description
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
Author: Daisuke Shindō
Publisher: Springer Nature
ISBN: 9819735378
Category : Condensed matter
Languages : en
Pages : 201
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Book Description
This book discusses the direct imaging of electric and magnetic fields of various functional materials using electron holography, providing indispensable information for understanding their electromagnetic properties. In order to clearly demonstrate the principles of this cutting-edge technology, easy-to-understand explanations are accompanied by numerous illustrations and figures throughout the book. The book highlights the dynamic nature of electromagnetic fields in novel materials, as revealed by changing temperature, or applying electric current and magnetic fields. Furthermore, it showcases, as a new development of the technique, the direct observation of accumulation and collective motion of electrons around charged insulators. Clear experimental data on electromagnetic fields and the motions of electrons help the reader understand their importance in materials science and fundamental physics. Seeing is believing!
Author: Enrique Saldivar-Guerra
Publisher: John Wiley & Sons
ISBN: 0470630329
Category : Technology & Engineering
Languages : en
Pages : 660
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Book Description
Covering a broad range of polymer science topics, Handbook of Polymer Synthesis, Characterization, and Processing provides polymer industry professionals and researchers in polymer science and technology with a single, comprehensive handbook summarizing all aspects involved in the polymer production chain. The handbook focuses on industrially important polymers, analytical techniques, and formulation methods, with chapters covering step-growth, radical, and co-polymerization, crosslinking and grafting, reaction engineering, advanced technology applications, including conjugated, dendritic, and nanomaterial polymers and emulsions, and characterization methods, including spectroscopy, light scattering, and microscopy.
Author: Kannan M. Krishnan
Publisher: Oxford University Press
ISBN: 0192566083
Category : Science
Languages : en
Pages : 550
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Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Author: Victorino Franco
Publisher: Springer Nature
ISBN: 3030704432
Category : Technology & Engineering
Languages : en
Pages : 814
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Book Description
This book discusses the most commonly used techniques for characterizing magnetic material properties and their applications. It provides a comprehensive and easily digestible collection and review of magnetic measurement techniques. It also examines the underlying operating principles and techniques of magnetic measurements, and presents current examples where such measurements and properties are relevant. Given the pervasive nature of magnetic materials in everyday life, this book is a vital resource for both professionals and students wishing to deepen their understanding of the subject.
Author:
Publisher: Academic Press
ISBN: 0123859824
Category : Technology & Engineering
Languages : en
Pages : 273
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
Author: Zhong Lin Wang
Publisher: 清华大学出版社有限公司
ISBN: 9787302054429
Category : Nanostructure materials
Languages : en
Pages : 424
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Book Description
纳米相和纳米结构材料是纳米科学和纳米技术的基础。纳米相和纳米结构材料手册是一套综述纳米学科在材料合成、结构和性能表征、理论模拟、实际应用和发展前沿的书籍。本书是这套丛书的第二本。书中内容详细阐述分析表征纳米材料的方法和技术。主要围绕表征技术在分析纳米材料原子结构和物理化学性能中的原理、数据分析过程和具体应用,并介绍了各种方法的最新进展和参考文献。
