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Author: Fernando Moreno
Publisher: Springer
ISBN: 3540466142
Category : Technology & Engineering
Languages : en
Pages : 293
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Book Description
The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.
Author: Fernando Moreno
Publisher: Springer
ISBN: 3540466142
Category : Technology & Engineering
Languages : en
Pages : 293
Get Book Here
Book Description
The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.
Author: Manuel Cardona
Publisher:
ISBN:
Category : Light
Languages : en
Pages : 351
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Book Description
Author: Orapin Wipasuramonton
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 560
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Book Description
Author: Fernando Moreno
Publisher: Springer
ISBN: 9783540669371
Category : Technology & Engineering
Languages : en
Pages : 300
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Book Description
The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.
Author: John Joseph Keane
Publisher:
ISBN:
Category : Polyethylene
Languages : en
Pages : 138
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Book Description
Author: Yat-Yin Au
Publisher:
ISBN:
Category : Brillouin scattering
Languages : en
Pages : 133
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Book Description
Abstract: In this thesis, the physics underlying the magnetic behavior of metallic microstructures, including their responses to magnetic fields and electric currents is explored. The dynamic and static components of the magnetization are respectively probed through Brillouin light scattering and Kerr imaging method. The design, growth and fabrication of various structures are presented, while the experimental findings are analyzed by theoretical modeling and calculations. The highlights include (a) Brillouin light scattering studies of spin precession under tunable magnetic field imbalance, (b) Kerr imaging of layer-by-layer magnetic reversal in cobalt-platinum multilayer, (c) Observation of spin-polarized current induced domain wall motion in magnetic microwires. All of these results demonstrate that light scattering as an excellent tool for probing novel functionality of metallic magnetic microstructures. Future prospects along the direction of research involved in this thesis are also presented.
Author: Morgan Thomas Schramm
Publisher:
ISBN:
Category : Color computer graphics
Languages : en
Pages : 228
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Book Description
Author: John Matthew Long
Publisher:
ISBN:
Category : Raman effect
Languages : en
Pages : 488
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Book Description
Author: Stephanie R. Squarcia
Publisher:
ISBN:
Category :
Languages : en
Pages : 100
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Book Description
Author: D.J. Lockwood
Publisher: Springer
ISBN: 1489936955
Category : Science
Languages : en
Pages : 592
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Book Description
Just over 25 years ago the first laser-excited Raman spectrum of any crystal was obtained. In November 1964, Hobden and Russell reported the Raman spectrum of GaP and later, in June 1965, Russell published the Si spectrum. Then, in July 1965, the forerunner of a series of meetings on light scattering in solids was held in Paris. Laser Raman spectroscopy of semiconductors was at the forefront in new developments at this meeting. Similar meetings were held in 1968 (New York), 1971 (Paris) and 1975 (Campinas). Since then, and apart from the multidisciplinary biennial International Conference on Raman Spectroscopy there has been no special forum for experts in light scattering spectroscopy of semiconductors to meet and discuss latest developments. Meanwhile, technological advances in semiconductor growth have given rise to a veritable renaissance in the field of semiconductor physics. Light scattering spectroscopy has played a crucial role in the advancement of this field, providing valuable information about the electronic, vibrational and structural properties both of the host materials, and of heterogeneous composite structures. On entering a new decade, one in which technological advances in lithography promise to open even broader horirons for semiconductor physics, it seemed to us to be an ideal time to reflect on the achievements of the past decade, to be brought up to date on the current state-of-the-art, and to catch some glimpses of where the field might be headed in the 1990s.
