LDEF Materials Workshop 1991, Part 1 PDF Download
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Author:
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Category :
Languages : en
Pages : 482
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Author:
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ISBN:
Category :
Languages : en
Pages : 482
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Author:
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Category : Aeronautics
Languages : en
Pages : 318
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Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 368
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Author: D. Dooling
Publisher:
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Category : Materials
Languages : en
Pages : 48
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Category : Government publications
Languages : en
Pages : 1096
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Category : Government publications
Languages : en
Pages : 1100
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Author:
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Category :
Languages : en
Pages : 536
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Author: J. Kleiman
Publisher: Springer Science & Business Media
ISBN: 9401007144
Category : Technology & Engineering
Languages : en
Pages : 354
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This publication presents the proceedings of ICPMSE-4, the fourth international conference on Protection of Materials and Structures from the Low Earth Orbit Space Environment, held in Toronto April 23-24, 1998. The conference was hosted and organized by Integrity Testing Laboratory Inc. (ITL), and held at the University ofToronto's Institute for Aerospace Studies (UTIAS). Twenty two industrial companies, six universities and fourteen government agencies from Canada, USA, United Kingdom, France, Israel, Russia, Ukraine and the Netherlands were represented by over 75 participants indicating increasing international co-operation in this critical arena of protection of materials in space. Twenty-seven speakers, world experts in their fields, delivered talks on a wide variety of topics on various aspects of material protection in space. Representatives from the Canadian, American, European and Israeli space agencies as well as from leading space research laboratories ofmajor aerospace industries gathered at UTIAS to discuss the latest developments in the field of material and structure protection from the harsh space environment.
Author: K.L. Mittal
Publisher: CRC Press
ISBN: 1000148475
Category : Science
Languages : en
Pages : 442
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This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
Author:
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Category : Space environment
Languages : en
Pages : 486
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