LabVIEW based Automation Guide for Microwave Measurements PDF Download
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Author: Satya Kesh Dubey
Publisher: Springer
ISBN: 9811062803
Category : Technology & Engineering
Languages : en
Pages : 56
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Book Description
The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC).
Author: Satya Kesh Dubey
Publisher: Springer
ISBN: 9811062803
Category : Technology & Engineering
Languages : en
Pages : 56
Get Book Here
Book Description
The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC).
Author: Dinesh K. Aswal
Publisher: Springer Nature
ISBN: 9811588724
Category : Technology & Engineering
Languages : en
Pages : 1084
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Book Description
This book describes the significance of metrology for inclusive growth in India and explains its application in the areas of physical–mechanical engineering, electrical and electronics, Indian standard time measurements, electromagnetic radiation, environment, biomedical, materials and Bhartiya Nirdeshak Dravyas (BND®). Using the framework of “Aswal Model”, it connects the metrology, in association with accreditation and standards, to the areas of science and technology, government and regulatory agencies, civil society and media, and various other industries. It presents critical analyses of the contributions made by CSIR-National Physical Laboratory (CSIR-NPL), India, through its world-class science and apex measurement facilities of international equivalence in the areas of industrial growth, strategic sector growth, environmental protection, cybersecurity, sustainable energy, affordable health, international trade, policy-making, etc. The book will be useful for science and engineering students, researchers, policymakers and entrepreneurs.
Author: Geoff H. Bryant
Publisher: IET
ISBN: 9780863412967
Category : Technology & Engineering
Languages : en
Pages : 434
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Book Description
Textbook covering a wide range of microwave measurements in the time and frequency domains, including reflectometry, the Smith chart, spectrum analyzers, vector and scalar analyzers, multiports, power, noise, frequency stability, time domain reflectometry, and a comprehensive account of antenna far and near field measurements. For young engineers requiring a good background in microwave measurement principles. Annotation copyrighted by Book News, Inc., Portland, OR
Author: Vitalii Ivanov
Publisher: Springer Nature
ISBN: 3031617975
Category :
Languages : en
Pages : 542
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Book Description
Author: Joel P. Dunsmore
Publisher: John Wiley & Sons
ISBN: 1119477123
Category : Technology & Engineering
Languages : en
Pages : 1067
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Book Description
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
Author: Polytechnic Institute of Brooklyn. Microwave Research Institute
Publisher:
ISBN:
Category : Microwave measurements
Languages : en
Pages : 1145
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Book Description
Author: Aunt Si Thu
Publisher:
ISBN:
Category :
Languages : en
Pages : 74
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Book Description
Author: Rahman Jamal
Publisher: Prentice Hall
ISBN: 9780130964236
Category : Science
Languages : en
Pages : 468
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Book Description
Put LabVIEW to work with solutions tailored to your specific field. LabVIEW brings the power and flexibility of graphical data-flow programming to virtually every technical subject. This robust, elegant language is used in communications, mathematics, statistics, and commercial data processing, as well as engineering. Once you have learned the basics of LabVIEW, you can master the nuances and fine tune your skills to create the customized tools you've been looking for. It's perfect for measurement, simulation, automation, and analysis of all types of data. LabVIEW Applications and Solutions gives you the expertise to develop your own virtual instruments, starting with a review of the theoretical foundations, illustrating each function with copious practical examples, and introducing LabVIEW 5.0 features. Among the specific applications are: Process visualization and control, including automation and fuzzy logic. Testing and measurement for quality management. Fourier transforms. Communications and networking issues. Mathematics. LabVIEW's newest capabilities are covered in depth, including: Image processing. Digital filter design. Control and simulation. BioBench and other medical applications. "LabVIEW Applications and Solutions" is a great textbook or reference for working engineers, professors, and students. Managers and decision-makers will also love the way it explains how to put LabVIEW to work in your own organization. It's the perfect follow-up to Lisa Wells and Jeff Travis' LabVIEW for Everyone, the classic introductory text published by Prentice Hall PTR. A free evaluation copy of LabVIEW 5.0 for Windows and Macintosh is included on CD-ROM to let youget right to work developing your own hands-on solutions. THIS BOOK IS PART OF THE NATIONAL INSTRUMENTS AND PRENTICE HALL PTR'S VIRTUAL INSTRUMENTATION SERIES.
Author: Max Sucher
Publisher:
ISBN:
Category : Microwave measurements
Languages : en
Pages : 146
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
