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Author: Alain Bellemare
Publisher: Lulu.com
ISBN: 2980984949
Category :
Languages : fr
Pages : 386
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Book Description
Author: Alain Bellemare
Publisher: Lulu.com
ISBN: 2980984949
Category :
Languages : fr
Pages : 386
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Book Description
Author: Hilary Bradt
Publisher: Bradt Travel Guides
ISBN: 9781841621975
Category : Travel
Languages : en
Pages : 508
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Book Description
A thorough travel guide, brimming with character, for bother independent visitors and those on organised tours to Madagascar.
Author: Gilberto Freyre
Publisher: Univ of California Press
ISBN: 9780520056824
Category : History
Languages : en
Pages : 532
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Book Description
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 354085049X
Category : Technology & Engineering
Languages : en
Pages : 284
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Book Description
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540850392
Category : Technology & Engineering
Languages : en
Pages : 271
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Book Description
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Author: Great Britain. Foreign Office
Publisher:
ISBN:
Category : Great Britain
Languages : en
Pages : 1436
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Author: Grande-Bretagne. Foreign Office. Library
Publisher:
ISBN:
Category : Eastern question
Languages : en
Pages : 768
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Book Description
Author: Great Britain. Parliament. House of Commons
Publisher:
ISBN:
Category : Bills, Legislative
Languages : en
Pages : 484
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Author: William Henry L.E. Bulwer (baron Dalling and Bulwer.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 462
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 648
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Book Description
