ISTFA 2006

ISTFA 2006 PDF Author: Electronic Device Failure Analysis Society
Publisher: ASM International
ISBN: 1615030891
Category : Technology & Engineering
Languages : en
Pages : 524

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Book Description

ISTFA 2006

ISTFA 2006 PDF Author: Electronic Device Failure Analysis Society
Publisher: ASM International
ISBN: 1615030891
Category : Technology & Engineering
Languages : en
Pages : 524

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Book Description


Istfa 2005

Istfa 2005 PDF Author: ASM International
Publisher: ASM International
ISBN: 1615030883
Category : Technology & Engineering
Languages : en
Pages : 524

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Book Description


ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis

ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis PDF Author: ASM International
Publisher: ASM International
ISBN: 1615030905
Category : Technology & Engineering
Languages : en
Pages : 372

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Book Description
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session

Thirty-fourth International Symposium for Testing and Failure Analysis

Thirty-fourth International Symposium for Testing and Failure Analysis PDF Author: ASM International
Publisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551

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Book Description


ISTFA 2009

ISTFA 2009 PDF Author:
Publisher: ASM International
ISBN: 1615030921
Category : Technology & Engineering
Languages : en
Pages : 371

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Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis PDF Author: ASM International
Publisher: ASM International
ISBN: 1627082735
Category : Technology & Engineering
Languages : en
Pages : 540

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Book Description
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

ISTFA 2013

ISTFA 2013 PDF Author: A. S. M. International
Publisher: ASM International
ISBN: 1627080228
Category : Technology & Engineering
Languages : en
Pages : 634

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Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

ISTFA 2014

ISTFA 2014 PDF Author: A. S. M. International
Publisher: ASM International
ISBN: 1627080740
Category : Technology & Engineering
Languages : en
Pages : 561

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Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.

ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis

ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis PDF Author: ASM International
Publisher: ASM International
ISBN: 1627081518
Category : Technology & Engineering
Languages : en
Pages : 666

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Book Description
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

ISTFA 2010

ISTFA 2010 PDF Author:
Publisher: ASM International
ISBN: 1615037276
Category : Technology & Engineering
Languages : en
Pages : 487

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Book Description