Ion-Solid Interactions, 1980 PDF Download
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Author: Walter Maxwell Gibson
Publisher: Institution of Electrical Engineers
ISBN: 9780852964576
Category : Energy-band theory of solids
Languages : en
Pages : 1652
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Book Description
Author: Walter Maxwell Gibson
Publisher: Institution of Electrical Engineers
ISBN: 9780852964576
Category : Energy-band theory of solids
Languages : en
Pages : 1652
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Book Description
Author: Michael Nastasi
Publisher: Cambridge University Press
ISBN: 052137376X
Category : Science
Languages : en
Pages : 572
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Book Description
Comprehensive guide to an important materials science technique for students and researchers.
Author: Wolfgang Eckstein
Publisher: Springer Science & Business Media
ISBN: 3642735134
Category : Science
Languages : en
Pages : 303
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Book Description
In this book the author discusses the investigation of ion bombardment of solids by computer simulation, with the aim of demonstrating the usefulness of this approach to the problem of interactions of ions with solids. The various chapters present the basic physics behind the simulation programs, their structure and many applications to different topics. The two main streams, the binary collision model and the classical dynamics model, are discussed, as are interaction potentials and electronic energy losses. The main topics investigated are backscattering, sputtering and implantation for incident atomic particles with energies from the eV to the MeV range. An extensive overview of the literature is given, making this book of interest to the active reseacher as well to students entering the field.
Author: Walter M. Gibson
Publisher:
ISBN:
Category :
Languages : en
Pages : 711
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Book Description
Author: Zinetula Insepov
Publisher: CRC Press
ISBN: 143987543X
Category : Science
Languages : en
Pages : 266
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Book Description
Cluster Ion-Solid Interactions: Theory, Simulation, and Experiment provides an overview of various concepts in cluster physics and related topics in physics, including the fundamentals and tools underlying novel cluster ion beam technology. The material is based on the author's highly regarded courses at Kyoto University, Purdue University, the Mos
Author: Walter M. Gibson
Publisher:
ISBN:
Category :
Languages : en
Pages : 608
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Book Description
Author: Walter M. Gibson
Publisher:
ISBN:
Category : Collisions (Physics)
Languages : en
Pages : 632
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Book Description
Author: Kevin J. Boyd
Publisher:
ISBN:
Category : Ion bombardment
Languages : en
Pages : 488
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Sarah Fearn
Publisher: Morgan & Claypool Publishers
ISBN: 1681740885
Category : Technology & Engineering
Languages : en
Pages : 67
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Book Description
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
