Author: International Symposium on X-Ray Optics and X-Ray MiPublisher: Academic Press
ISBN: 9780125470506
Category :
Languages : en
Pages :
Book Description
Proceedings of the International Symposium on X-Ray Optics and X-Ray Microanalysis, 3rd, Stanford, California, 1962
Author: International Symposium on X-Ray Optics and X-Ray MiPublisher: Academic Press
ISBN: 9780125470506
Category :
Languages : en
Pages :
Book Description
X-Ray Optics and X-Ray Microanalysis
Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 622
Book Description
International Symposium on X-ray Optics and X-ray Microanalysis
Author: Howard Hunt PatteePublisher:
ISBN:
Category : X-rays
Languages : en
Pages : 648
Book Description
X-ray Optics and X-ray Microanalysis
Author: Vernon Ellis CosslettPublisher:
ISBN:
Category : Microradiography
Languages : en
Pages : 0
Book Description
X-Ray optics and X-Ray microanalysis : Third International Symposium
Author: H. H. PatteePublisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
X-RAY OPTICS AND X-RAY MICROANALYSIS- PROCEEDINGS- 3RD INTERNATIONAL SYMPOSIUM.
Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Visits to Organizations Concerned with Electron and X-ray Microanalysis in the United States
Author: R. J. TraillPublisher:
ISBN:
Category :
Languages : en
Pages : 104
Book Description
Proceedings of the International Conference on X-Ray Optics and Microanalysis
Author: Publisher:
ISBN:
Category :
Languages : de
Pages :
Book Description
Stanford, 1962. X-Ray Optics and X-Ray Microanalysis. Edited by H.H. Pattee ... V.E. Cosslett ... Arne Engström ... Third International Symposium, Stanford University, Stanford, California. August, 1962. (Sponsored by the Biophysics Laboratory of Stanford University.).
Author: INTERNATIONAL SYMPOSIUM ON X-RAY OPTICS AND X-RAY MICROANALYSIS.Publisher:
ISBN:
Category :
Languages : en
Pages : 622
Book Description
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Author: Gottfried MöllenstedtPublisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : de
Pages : 624
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
