Internal Reflection and ATR Spectroscopy PDF Download
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Author: Milan Milosevic
Publisher: John Wiley & Sons
ISBN: 0470278323
Category : Science
Languages : en
Pages : 262
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Book Description
Attenuated Total Reflection (ATR) Spectroscopy is now the most frequently used sampling technique for infrared spectroscopy. This book fully explains the theory and practice of this method. Offers introduction and history of ATR before discussing theoretical aspects Includes informative illustrations and theoretical calculations Discusses many advanced aspects of ATR, such as depth profiling or orientation studies, and particular features of reflectance
Author: Milan Milosevic
Publisher: John Wiley & Sons
ISBN: 0470278323
Category : Science
Languages : en
Pages : 262
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Book Description
Attenuated Total Reflection (ATR) Spectroscopy is now the most frequently used sampling technique for infrared spectroscopy. This book fully explains the theory and practice of this method. Offers introduction and history of ATR before discussing theoretical aspects Includes informative illustrations and theoretical calculations Discusses many advanced aspects of ATR, such as depth profiling or orientation studies, and particular features of reflectance
Author: N. J. Harrick
Publisher:
ISBN:
Category :
Languages : en
Pages : 352
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Book Description
Author: Francis M. Mirabella
Publisher: CRC Press
ISBN: 9780824787301
Category : Science
Languages : en
Pages : 392
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Book Description
Presents coverage of internal reflection spectroscopy (IRS) and its applications to polymer, semiconductor, biological, electrochemical and membrane research. It describes the theory and procedures and identifies the spectral regions, from materials characterization to process monitoring.
Author: Philip F. Kane
Publisher: Springer Science & Business Media
ISBN: 1461344905
Category : Technology & Engineering
Languages : en
Pages : 675
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Book Description
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Author: Patricia B. Coleman
Publisher: CRC Press
ISBN: 9780849342035
Category : Science
Languages : en
Pages : 320
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Book Description
Practical Sampling Techniques for Infrared Analysis provides a single-source guide to sample handling for routine analysis in infrared spectroscopy using commercially available instrumentation and accessories. Following a review of infrared spectroscopic theory, chapters consider individual techniques such as transmission methodology (e.g., solution cells, KBr pellets), internal reflectance, diffuse reflectance, photoacoustic FT-IR, infrared microscopy, GC/FT-IR, and quantitative analysis. In addition, two chapters elaborate on both typical and unusual samples and problems encountered in industrial laboratories and the process by which a spectroscopist chooses the most effective technique. Various short courses on infrared analysis are also listed. Practical Sampling Techniques for Infrared Analysis will be an important guide for all professional analytical chemists and technicians.
Author: Michele R. Derrick
Publisher: Getty Publications
ISBN: 0892364696
Category : Art
Languages : en
Pages : 252
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Book Description
This book provides practical information on the use of infrared (IR) spectroscopy for the analysis of materials found in cultural objects. Designed for scientists and students in the fields of archaeology, art conservation, microscopy, forensics, chemistry, and optics, the book discusses techniques for examining the microscopic amounts of complex, aged components in objects such as paintings, sculptures, and archaeological fragments. Chapters include the history of infrared spectroscopy, the basic parameters of infrared absorption theory, IR instrumentation, analysis methods, sample collection and preparation, and spectra interpretation. The authors cite several case studies, such as examinations of Chumash Indian paints and the Dead Sea Scrolls. The Institute’s Tools for Conservation series provides practical scientific procedures and methodologies for the practice of conservation. The series is specifically directed to conservation scientists, conservators, and technical experts in related fields.
Author: W. Suëtaka
Publisher: Springer Science & Business Media
ISBN: 9780306449635
Category : Science
Languages : en
Pages : 294
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Book Description
Written with engineers and researchers in mind, author W. Suëtka offers a well-illustrated, basic reference on the use of infrared (IR) and Raman spectroscopy in the investigation of surfaces of practical materials. This book only requires a basic knowledge of vibrational spectroscopy for understanding the included discussions. Chapters illustrate applications of IR and Raman spectroscopy in the investigation of a variety of real surfaces. Featured in this volume are the typical results obtained for species on clean and well-defined surfaces in ultrahigh vacuum environments.
Author: Frederique de Fornel
Publisher: Springer Science & Business Media
ISBN: 9783540658450
Category : Science
Languages : en
Pages : 292
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Book Description
Evanescent waves have become increasingly important to many areas of physics and optical engineering. This book is the first comprehensive presentation on the topic, covering the role of evanescent waves in areas such as guided optics, optical-fiber couplers, integrated optical elements, internal reflection spectroscopy, atom optics, dark-field microscopy, scanning tunneling optical microscopy, microaperture microscopy, and apertureless microscopies.
Author: Francis M. Mirabella
Publisher:
ISBN: 9780933946149
Category : Science
Languages : en
Pages : 195
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Book Description
Author: Gustav Kortüm
Publisher: Springer Science & Business Media
ISBN: 3642880711
Category : Science
Languages : en
Pages : 372
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Book Description
Reflectance spectroscopy is the investigation of the spectral composi tion of surface-reflected radiation with respect to its angularly dependent intensity and the composition of the incident primary radiation. Two limiting cases are important: The first concerns regular (specular) reflection from a smooth surface, and the second diffuse reflection from an ideal matte surface. All possible variations are found in practice between these two extremes. For the two extreme cases, two fundamentally different methods of reflectance spectroscopy are employed: The first of these consists in evaluating the optical constants n (refractive index) and x (absorption index) from the measured regular reflection by means of the Fresnel equations as a function of the wave A. This rather old and very troublesome procedure, which is length incapable of very accurate results, has recently been modified by Fahren fort by replacing the air-sample phase boundary by the phase boundary between a dielectric of higher refractive index (n ) and the sample (n ). 1 2 If the sample absorbs no radiation and the angle of incidence exceeds a certain definite value, total reflection occurs. On close optical contact between the two phases, a small amount of energy is transferred into the less dense phase because of diffraction phenomena at the edges of the incident beam. The energy flux in the two directions through the phase boundary caused by this is equal, however, so that 'total reflection takes place.
