Selected Papers on Interference, Interferometry, and Interferometric Metrology PDF Download
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Author: P. Hariharan
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 730
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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author: P. Hariharan
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 730
Get Book Here
Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author: P. Hariharan
Publisher: Academic Press
ISBN: 0123116309
Category : Science
Languages : en
Pages : 369
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Book Description
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Author: Klaus D. Hinsch
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 710
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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author: Alexandr Banishev
Publisher: BoD – Books on Demand
ISBN: 9535129554
Category : Technology & Engineering
Languages : en
Pages : 262
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Book Description
Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.
Author: Lazo M. Manojlović
Publisher: CRC Press
ISBN: 1000565300
Category : Technology & Engineering
Languages : en
Pages : 342
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Book Description
The need for both intrinsic and extrinsic fiber-optic sensor technologies continues to grow. To meet the demands of this fast-expanding applications-driven market, this book discusses both the latest advances and recent application opportunities along with the basic optical phenomena, with the main emphasis on applying optical knowledge for solving real-life engineering problems. Key features of the book: • Highlights the uniqueness of fiber-optics sensors • Presents state-of-the-art technology in optical fiber sensors • Discusses a variety of fiber-optic topologies • Considers different detection techniques • Gives special attention to distributed fiber-optic sensing systems Basic tools and concepts are presented in the earlier chapters, which are then developed in more detail in the later chapters. The book is organized in seven chapters covering a broad range of fiber-optical sensing phenomena. Written for undergraduate and graduate students who want to broaden their knowledge of fiber-optic sensing system applications for real-life engineering problems, the volume is also valuable for engineers who want to acquire the basic principles of optics, especially fiber-optics.
Author: Bahaa E. A. Saleh
Publisher: John Wiley & Sons
ISBN: 1119702119
Category : Technology & Engineering
Languages : en
Pages : 2127
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Book Description
Fundamentals of Photonics A complete, thoroughly updated, full-color third edition Fundamentals of Photonics, Third Edition is a self-contained and up-to-date introductory-level textbook that thoroughly surveys this rapidly expanding area of engineering and applied physics. Featuring a blend of theory and applications, coverage includes detailed accounts of the primary theories of light, including ray optics, wave optics, electromagnetic optics, and photon optics, as well as the interaction of light and matter. Presented at increasing levels of complexity, preliminary sections build toward more advanced topics, such as Fourier optics and holography, photonic-crystal optics, guided-wave and fiber optics, LEDs and lasers, acousto-optic and electro-optic devices, nonlinear optical devices, ultrafast optics, optical interconnects and switches, and optical fiber communications. The third edition features an entirely new chapter on the optics of metals and plasmonic devices. Each chapter contains highlighted equations, exercises, problems, summaries, and selected reading lists. Examples of real systems are included to emphasize the concepts governing applications of current interest. Each of the twenty-four chapters of the second edition has been thoroughly updated.
Author: Vladimir Evseevich Zuev
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 600
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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author: Roland Winston
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 652
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Book Description
Author: Olivério D.D. Soares
Publisher: Springer Science & Business Media
ISBN: 9400936095
Category : Science
Languages : en
Pages : 794
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Book Description
Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.
Author: Peter Langenbeck
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819491404
Category : Science
Languages : en
Pages : 243
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Book Description
Interferometry can be seen as the stethoscope of the precision optical engineer. This book presents various interferometric developments used in physical, optical, and mechanical engineering during the past half century. It is an expanded translation of one chapter of the German Wirtschaftliche Mikrobearbeitung, also by Langenbeck, published by Carl Hanser Verlag, Munich-Vienna, in 2009. The book is illustrated with many practical examples and photographs that are a direct consequence of the author’s vast experience in the subject. The author provides some little-known testing techniques that could lead to future innovation in interferometric testing, along with occasional ""Notes for the practitioner,"" which give the reader tips for successful implementation of the author’s repertoire of techniques. The text will be of value to anyone interested in learning about interferometric evaluation of small mechanical and optical components.
