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Author: Clyde L. Briant
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 546
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Book Description
The study of interfaces is one of the oldest areas of research in materials science. The presence of grain boundaries in materials has long been recognized, as has its crucial role in determining mechanical properties. Another long-recognized concept is that the properties of a surface are quite different from those of the bulk. In recent years, researchers have been able to study these interfaces, both internal and external, with a detail not before possible. These advances have stemmed from the ability to obtain atomic resolution images of interfaces, to measure accurate chemical compositions of interfaces, and to model these interfaces and their properties. This volume goes a step further, beyond structural and chemical studies, to explore how all of this information can be used to engineer interfaces for improved properties and overall improved material performance. Significant attention is given to the crystallographic nature of grain boundaries and interfaces, and the relationship between this nature and the performance of a material. The versatility of electron back-scattering pattern analysis (EBSP) in solving a number of interface-related problems is also featured.
Author: Clyde L. Briant
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 546
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Book Description
The study of interfaces is one of the oldest areas of research in materials science. The presence of grain boundaries in materials has long been recognized, as has its crucial role in determining mechanical properties. Another long-recognized concept is that the properties of a surface are quite different from those of the bulk. In recent years, researchers have been able to study these interfaces, both internal and external, with a detail not before possible. These advances have stemmed from the ability to obtain atomic resolution images of interfaces, to measure accurate chemical compositions of interfaces, and to model these interfaces and their properties. This volume goes a step further, beyond structural and chemical studies, to explore how all of this information can be used to engineer interfaces for improved properties and overall improved material performance. Significant attention is given to the crystallographic nature of grain boundaries and interfaces, and the relationship between this nature and the performance of a material. The versatility of electron back-scattering pattern analysis (EBSP) in solving a number of interface-related problems is also featured.
Author:
Publisher:
ISBN:
Category : Grain boundaries
Languages : en
Pages : 336
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Book Description
Author: C. Barry Carter
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 338
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2000, concentrates on the preparation and processing of interfaces, the relationships between chemistry and structure and the properties and behavior of interfaces, particularly in relation to strength and bonding.
Author: Christopher A. Schuh
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 336
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Fernando A. Ponce
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1290
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Book Description
Author: C. A. Angell
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 544
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Book Description
This book brings together researchers from various backgrounds dealing with the manifestations of the glassy or liquid state of matter, and with the ubiquitous characteristics of the structure and dynamic properties. The goal of this book is to compare the relative merits of different theoretical, computational and experimental approaches to the subject, and to promote the exchange of ideas between the individual disciplines. Papers reflect state-of-the-art knowledge on processes involved in glass formation, and on the relationships between structure and properties of glass-forming liquids, synthetic polymers and biopolymers. Emphasis is on novel experimental techniques, developments in computational methods, and on recent theoretical models which are improving the understanding of the observed phenomena. Topics include: short-time dynamics; relaxation dynamics of glasses and glass formers; glass-like systems, simulations and models; contrasting metallic, ionic, bio and polymer systems; structure, energetics and polyamorphism; and structure and dynamics of glasses and glass formers.
Author:
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ISBN:
Category : Heat resistant alloys
Languages : en
Pages : 808
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Book Description
Author: C. C. Koch
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 818
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book focuses specifically on processing and microstructural control, alloy design, mechanical properties and industrial applications. Examples of structural applications of the 'mature' intermetallics, TiAl and Ni3Al are also featured.
Author: J. Joseph Clement
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 488
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Book Description
The inexorable drive for increased integrated circuit functionality and performance places growing demands on the metal and dielectric thin films used in fabricating these circuits, as well as spurring demand for new materials applications and processes. This book directly addresses issues of widespread concern in the microelectronics industry - smaller feature sizes, new materials and new applications that challenge the reliability of new technologies. While the book continues the focus on issues related to interconnect reliability, such as electromigration and stress, particular emphasis is placed on the effects of microstructure. An underlying theme is understanding the importance of interactions among different materials and associated interfaces comprising a single structure with dimensions near or below the micrometer scale. Topics include: adhesion and fracture; gate oxide growth and oxide interfaces; surface preparation and gate oxide reliability; oxide degradation and defects; micro-structure, texture and reliability; novel measurement techniques; interconnect performance and reliability modeling; electromigration and interconnect reliability and stress and stress relaxation.
Author:
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ISBN:
Category : Catalysts
Languages : en
Pages : 334
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Book Description
