Integrated Circuit Defect-Sensitivity: Theory and Computational Models PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Integrated Circuit Defect-Sensitivity: Theory and Computational Models PDF full book. Access full book title Integrated Circuit Defect-Sensitivity: Theory and Computational Models by Jose Pineda de Gyvez. Download full books in PDF and EPUB format.
Author: Jose Pineda de Gyvez
Publisher: Springer
ISBN: 9780792393061
Category : Technology & Engineering
Languages : en
Pages : 167
Get Book Here
Book Description
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.
Author: Jose Pineda de Gyvez
Publisher: Springer
ISBN: 9780792393061
Category : Technology & Engineering
Languages : en
Pages : 167
Get Book Here
Book Description
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.
Author: Jose Pineda De Gyvez
Publisher:
ISBN: 9781461531593
Category :
Languages : en
Pages : 196
Get Book Here
Book Description
Author: José Pineda de Gyvez
Publisher: Springer Science & Business Media
ISBN: 1461531586
Category : Technology & Engineering
Languages : en
Pages : 181
Get Book Here
Book Description
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.
Author: José Jesús de Pineda de Gyvez
Publisher:
ISBN:
Category :
Languages : en
Pages : 120
Get Book Here
Book Description
Author: José de Jesús Pineda de Gyvez
Publisher:
ISBN: 9789090039695
Category :
Languages : en
Pages : 120
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892
Get Book Here
Book Description
Author: José Pineda de Gyvez
Publisher: John Wiley & Sons
ISBN: 0780334477
Category : Technology & Engineering
Languages : en
Pages : 338
Get Book Here
Book Description
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Author: John H. Lau
Publisher: Springer Science & Business Media
ISBN: 9780442014414
Category : Computers
Languages : en
Pages : 584
Get Book Here
Book Description
This book is a one-stop guide to the state of the art of COB technology. For professionals active in COB and MCM research and development, those who wish to master COB and MCM problem-solving methods, and those who must choose a cost-effective design and high-yield manufacturing process for their interconnect systems, here is a timely summary of progress in al aspects of this fascinating field. It meets the reference needs of design, material, process, equipment, manufacturing, quality, reliability, packaging, and system engineers, and technical managers working in electronic packaging and interconnection.
Author:
Publisher:
ISBN:
Category : Bibliographical literature
Languages : en
Pages : 1128
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Fault-tolerant computing
Languages : en
Pages : 326
Get Book Here
Book Description
