Instrumentation, Metrology, and Standards for Nanomanufacturing III

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Languages : en
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Instrumentation, Metrology, and Standards for Nanomanufacturing III

Instrumentation, Metrology, and Standards for Nanomanufacturing III PDF Author:
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Languages : en
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Instrumentation, Metrology, and Standards for Nanomanufacturing IV

Instrumentation, Metrology, and Standards for Nanomanufacturing IV PDF Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178

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Includes Proceedings Vol. 7821

Instrumentation, Metrology, and Standards for Nanomanufacturing

Instrumentation, Metrology, and Standards for Nanomanufacturing PDF Author:
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ISBN:
Category :
Languages : en
Pages :

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Instrumentation, Metrology, and Standards for Nanomanufacturing II

Instrumentation, Metrology, and Standards for Nanomanufacturing II PDF Author: Michael T. Postek
Publisher: Society of Photo Optical
ISBN: 9780819472625
Category : Technology & Engineering
Languages : en
Pages : 200

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Includes Proceedings Vol. 7821

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V PDF Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132

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Includes Proceedings Vol. 7821

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI PDF Author: Michael T. Postek
Publisher:
ISBN: 9780819491831
Category : Microfabrication
Languages : en
Pages : 194

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Includes Proceedings Vol. 7821

Instrumentation, Metrology, and Standards for Nanomanufacturing III : 3-5 August 2009, San Diego, California, United States

Instrumentation, Metrology, and Standards for Nanomanufacturing III : 3-5 August 2009, San Diego, California, United States PDF Author:
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Category : Microfabrication
Languages : en
Pages :

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Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII PDF Author: Michael T. Postek
Publisher:
ISBN: 9780819496690
Category : Technology & Engineering
Languages : en
Pages : 110

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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII PDF Author: Michael T. Postek
Publisher:
ISBN: 9781628412000
Category : Microfabrication
Languages : en
Pages : 277

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Instrumentation, Metrology, and Standards for Nanotechnology

Instrumentation, Metrology, and Standards for Nanotechnology PDF Author: National Science and Technology Council (U.S.). Interagency Working Group on Manufacturing Research and Development
Publisher:
ISBN:
Category : Metrology
Languages : en
Pages : 131

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