In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II

In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II PDF Author: Sergio Ajuria
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 258

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Book Description
A collection of papers on in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing. They cover: electrical/field emission techniques; optical and em-wave techniques; and surface photovoltage techniques.

In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II

In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II PDF Author: Sergio Ajuria
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 258

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Book Description
A collection of papers on in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing. They cover: electrical/field emission techniques; optical and em-wave techniques; and surface photovoltage techniques.

In-line Characterization, Yield Reliability, and Failure Analysis in Microelectronics Manufacturing

In-line Characterization, Yield Reliability, and Failure Analysis in Microelectronics Manufacturing PDF Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 360

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Book Description


In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing

In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing PDF Author: Damon DeBusk
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Integrated circuits
Languages : en
Pages : 186

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Book Description


Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes PDF Author: Bernd O. Kolbesen (Chemiker.)
Publisher: The Electrochemical Society
ISBN: 9781566772396
Category : Technology & Engineering
Languages : en
Pages : 568

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In-line Methods and Monitors for Process and Yield Improvement

In-line Methods and Monitors for Process and Yield Improvement PDF Author: Sergio Ajuria
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 352

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Book Description
These conference proceedings consist of 47 papers addressing a variety of issues concerning in-line methods and monitors for process and yield improvement.

Silicon Epitaxy

Silicon Epitaxy PDF Author:
Publisher: Elsevier
ISBN: 0080541003
Category : Science
Languages : en
Pages : 514

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Book Description
Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The Willardson and Beer series, as it is widely known, has succeeded in producing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise that this tradition will be maintained and even expanded.

Directory of Published Proceedings

Directory of Published Proceedings PDF Author:
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 166

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Book Description


International Journal of Materials & Product Technology

International Journal of Materials & Product Technology PDF Author:
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 554

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Book Description


Handbook of Silicon Based MEMS Materials and Technologies

Handbook of Silicon Based MEMS Materials and Technologies PDF Author: Markku Tilli
Publisher: Elsevier
ISBN: 0815519885
Category : Technology & Engineering
Languages : en
Pages : 670

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Book Description
A comprehensive guide to MEMS materials, technologies and manufacturing, examining the state of the art with a particular emphasis on current and future applications. Key topics covered include: - Silicon as MEMS material - Material properties and measurement techniques - Analytical methods used in materials characterization - Modeling in MEMS - Measuring MEMS - Micromachining technologies in MEMS - Encapsulation of MEMS components - Emerging process technologies, including ALD and porous silicon Written by 73 world class MEMS contributors from around the globe, this volume covers materials selection as well as the most important process steps in bulk micromachining, fulfilling the needs of device design engineers and process or development engineers working in manufacturing processes. It also provides a comprehensive reference for the industrial R&D and academic communities. - Veikko Lindroos is Professor of Physical Metallurgy and Materials Science at Helsinki University of Technology, Finland. - Markku Tilli is Senior Vice President of Research at Okmetic, Vantaa, Finland. - Ari Lehto is Professor of Silicon Technology at Helsinki University of Technology, Finland. - Teruaki Motooka is Professor at the Department of Materials Science and Engineering, Kyushu University, Japan. - Provides vital packaging technologies and process knowledge for silicon direct bonding, anodic bonding, glass frit bonding, and related techniques - Shows how to protect devices from the environment and decrease package size for dramatic reduction of packaging costs - Discusses properties, preparation, and growth of silicon crystals and wafers - Explains the many properties (mechanical, electrostatic, optical, etc), manufacturing, processing, measuring (incl. focused beam techniques), and multiscale modeling methods of MEMS structures

Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing

Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing PDF Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 324

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Book Description