Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 23
Book Description
In this paper we derive equations for the image formation of transverse profile of a relativistic beam obtained by means of optical transition radiation (OTR) from flat and rough metal surfaces. The motivation behind this study lies in the desire to suppress coherent transition radiation (COTR) observed in experiments at modern free electron lasers. The physical mechanism behind the problem of COTR is that the OTR is predominantly radiated at small angles of order of 1/? where? is the relativistic factor of the beam. This means that the transverse formation size of the image is of order of {bar?}? where {bar?} = {lambda}/2? with {lambda} the radiation wavelength. For relativistic beams this can be comparable or even exceed the transverse size of the beam, which would mean that the image of the beam has very little to do with its transverse profile. It is fortuitous, however, that the incoherent image is formed by adding radiation energy of electrons and results in the transverse formation size being of order of {bar {lambda}}/?{sub a}, with?{sub a} is the aperture angle of the optical system. The COTR image, in contrast, is formed by adding electromagnetic field of electrons, and leads to the formation size {bar {lambda}}?. In situations when the COTR intensity exceeds that of OTR the COTR imaging makes the diagnostic incapable of measuring the beam profile.
Image Formation by Incoherent and Coherent Transition Radiation from Flat and Rough Surfaces
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 23
Book Description
In this paper we derive equations for the image formation of transverse profile of a relativistic beam obtained by means of optical transition radiation (OTR) from flat and rough metal surfaces. The motivation behind this study lies in the desire to suppress coherent transition radiation (COTR) observed in experiments at modern free electron lasers. The physical mechanism behind the problem of COTR is that the OTR is predominantly radiated at small angles of order of 1/? where? is the relativistic factor of the beam. This means that the transverse formation size of the image is of order of {bar?}? where {bar?} = {lambda}/2? with {lambda} the radiation wavelength. For relativistic beams this can be comparable or even exceed the transverse size of the beam, which would mean that the image of the beam has very little to do with its transverse profile. It is fortuitous, however, that the incoherent image is formed by adding radiation energy of electrons and results in the transverse formation size being of order of {bar {lambda}}/?{sub a}, with?{sub a} is the aperture angle of the optical system. The COTR image, in contrast, is formed by adding electromagnetic field of electrons, and leads to the formation size {bar {lambda}}?. In situations when the COTR intensity exceeds that of OTR the COTR imaging makes the diagnostic incapable of measuring the beam profile.
Publisher:
ISBN:
Category :
Languages : en
Pages : 23
Book Description
In this paper we derive equations for the image formation of transverse profile of a relativistic beam obtained by means of optical transition radiation (OTR) from flat and rough metal surfaces. The motivation behind this study lies in the desire to suppress coherent transition radiation (COTR) observed in experiments at modern free electron lasers. The physical mechanism behind the problem of COTR is that the OTR is predominantly radiated at small angles of order of 1/? where? is the relativistic factor of the beam. This means that the transverse formation size of the image is of order of {bar?}? where {bar?} = {lambda}/2? with {lambda} the radiation wavelength. For relativistic beams this can be comparable or even exceed the transverse size of the beam, which would mean that the image of the beam has very little to do with its transverse profile. It is fortuitous, however, that the incoherent image is formed by adding radiation energy of electrons and results in the transverse formation size being of order of {bar {lambda}}/?{sub a}, with?{sub a} is the aperture angle of the optical system. The COTR image, in contrast, is formed by adding electromagnetic field of electrons, and leads to the formation size {bar {lambda}}?. In situations when the COTR intensity exceeds that of OTR the COTR imaging makes the diagnostic incapable of measuring the beam profile.
Particle Physics Reference Library
Author: Christian W. Fabjan
Publisher: Springer Nature
ISBN: 3030353184
Category : Elementary particles (Physics).
Languages : en
Pages : 1083
Book Description
This second open access volume of the handbook series deals with detectors, large experimental facilities and data handling, both for accelerator and non-accelerator based experiments. It also covers applications in medicine and life sciences. A joint CERN-Springer initiative, the "Particle Physics Reference Library" provides revised and updated contributions based on previously published material in the well-known Landolt-Boernstein series on particle physics, accelerators and detectors (volumes 21A, B1,B2,C), which took stock of the field approximately one decade ago. Central to this new initiative is publication under full open access
Publisher: Springer Nature
ISBN: 3030353184
Category : Elementary particles (Physics).
Languages : en
Pages : 1083
Book Description
This second open access volume of the handbook series deals with detectors, large experimental facilities and data handling, both for accelerator and non-accelerator based experiments. It also covers applications in medicine and life sciences. A joint CERN-Springer initiative, the "Particle Physics Reference Library" provides revised and updated contributions based on previously published material in the well-known Landolt-Boernstein series on particle physics, accelerators and detectors (volumes 21A, B1,B2,C), which took stock of the field approximately one decade ago. Central to this new initiative is publication under full open access
X-Ray and Neutron Reflectivity: Principles and Applications
Author: Jean Daillant
Publisher: Springer Science & Business Media
ISBN: 3540486968
Category : Science
Languages : en
Pages : 347
Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Publisher: Springer Science & Business Media
ISBN: 3540486968
Category : Science
Languages : en
Pages : 347
Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Journal of the Optical Society of America
Author:
Publisher:
ISBN:
Category : Imaging systems
Languages : en
Pages : 708
Book Description
Publisher:
ISBN:
Category : Imaging systems
Languages : en
Pages : 708
Book Description
Catalog of National Bureau of Standards Publications, 1966-1976
Author: United States. National Bureau of Standards. Technical Information and Publications Division
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 854
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 854
Book Description
Catalog of National Bureau of Standards Publications, 1966-1976
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 844
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 844
Book Description
Catalog of National Bureau of Standards Publications, 1966-1976: pt. 1-2. Key word index
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 844
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 844
Book Description
Optics Letters
Author:
Publisher:
ISBN:
Category : Optics
Languages : en
Pages : 900
Book Description
Publisher:
ISBN:
Category : Optics
Languages : en
Pages : 900
Book Description
Radiation Oncology Physics
Author: International Atomic Energy Agency
Publisher: IAEA
ISBN:
Category : Business & Economics
Languages : en
Pages : 704
Book Description
This publication is aimed at students and teachers involved in teaching programmes in field of medical radiation physics, and it covers the basic medical physics knowledge required in the form of a syllabus for modern radiation oncology. The information will be useful to those preparing for professional certification exams in radiation oncology, medical physics, dosimetry or radiotherapy technology.
Publisher: IAEA
ISBN:
Category : Business & Economics
Languages : en
Pages : 704
Book Description
This publication is aimed at students and teachers involved in teaching programmes in field of medical radiation physics, and it covers the basic medical physics knowledge required in the form of a syllabus for modern radiation oncology. The information will be useful to those preparing for professional certification exams in radiation oncology, medical physics, dosimetry or radiotherapy technology.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 902
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 902
Book Description