IEEE Standard Test Methods for Surge Protectors Used in Low-voltage Data, Communications, and Signaling Circuits PDF Download

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IEEE Standard Test Methods for Surge Protectors Used in Low-voltage Data, Communications, and Signaling Circuits

IEEE Standard Test Methods for Surge Protectors Used in Low-voltage Data, Communications, and Signaling Circuits PDF Author:
Publisher:
ISBN: 9781559371612
Category : Transients (Electricity)
Languages : en
Pages : 34

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IEEE Standard Test Methods for Surge Protectors Used in Low-voltage Data, Communications, and Signaling Circuits

IEEE Standard Test Methods for Surge Protectors Used in Low-voltage Data, Communications, and Signaling Circuits PDF Author:
Publisher:
ISBN: 9781559371612
Category : Transients (Electricity)
Languages : en
Pages : 34

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Book Description

IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits - Redline

IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits - Redline PDF Author:
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ISBN:
Category :
Languages : en
Pages :

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IEEE Std C62.36-2000: IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

IEEE Std C62.36-2000: IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits PDF Author:
Publisher:
ISBN: 9780738125237
Category : Electric circuits
Languages : en
Pages : 0

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Methods for testing and measuring the characteristics of surge protectors used in low-voiltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V dc are established. The Surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test mathods for low-voltage power circuit applications, surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.

IEEE Std C62.36-2014 (Revision of IEEE Std C62.36-2000)

IEEE Std C62.36-2014 (Revision of IEEE Std C62.36-2000) PDF Author:
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Languages : en
Pages :

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C62.36-2014 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

C62.36-2014 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits PDF Author:
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Languages : en
Pages :

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IEEE Draft Standard for Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

IEEE Draft Standard for Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits PDF Author:
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Category :
Languages : en
Pages :

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IEEE Std C62.36-1991

IEEE Std C62.36-1991 PDF Author:
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Languages : en
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C62.36-1991 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

C62.36-1991 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits PDF Author:
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Languages : en
Pages :

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IEEE Std C62.36-2014 (Revision of IEEE Std C62.36-2000) - Redline

IEEE Std C62.36-2014 (Revision of IEEE Std C62.36-2000) - Redline PDF Author:
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ISBN:
Category :
Languages : en
Pages :

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IEEE PC62.36/D16, October 2013

IEEE PC62.36/D16, October 2013 PDF Author:
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ISBN: 9780738187624
Category :
Languages : en
Pages :

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