IEEE No 308-1970 PDF Download
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Languages : en
Pages :
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Languages : en
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Category : Nuclear energy
Languages : en
Pages : 1256
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Category : Weights and measures
Languages : en
Pages : 732
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Author: Koen Lampaert
Publisher: Springer Science & Business Media
ISBN: 147574501X
Category : Technology & Engineering
Languages : en
Pages : 186
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Book Description
Analog integrated circuits are very important as interfaces between the digital parts of integrated electronic systems and the outside world. A large portion of the effort involved in designing these circuits is spent in the layout phase. Whereas the physical design of digital circuits is automated to a large extent, the layout of analog circuits is still a manual, time-consuming and error-prone task. This is mainly due to the continuous nature of analog signals, which causes analog circuit performance to be very sensitive to layout parasitics. The parasitic elements associated with interconnect wires cause loading and coupling effects that degrade the frequency behaviour and the noise performance of analog circuits. Device mismatch and thermal effects put a fundamental limit on the achievable accuracy of circuits. For successful automation of analog layout, advanced place and route tools that can handle these critical parasitics are required. In the past, automatic analog layout tools tried to optimize the layout without quantifying the performance degradation introduced by layout parasitics. Therefore, it was not guaranteed that the resulting layout met the specifications and one or more layout iterations could be needed. In Analog Layout Generation for Performance and Manufacturability, the authors propose a performance driven layout strategy to overcome this problem. In this methodology, the layout tools are driven by performance constraints, such that the final layout, with parasitic effects, still satisfies the specifications of the circuit. The performance degradation associated with an intermediate layout solution is evaluated at runtime using predetermined sensitivities. In contrast with other performance driven layout methodologies, the tools proposed in this book operate directly on the performance constraints, without an intermediate parasitic constraint generation step. This approach makes a complete and sensible trade-off between the different layout alternatives possible at runtime and therefore eliminates the possible feedback route between constraint derivation, placement and layout extraction. Besides its influence on the performance, layout also has a profound impact on the yield and testability of an analog circuit. In Analog Layout Generation for Performance and Manufacturability, the authors outline a new criterion to quantify the detectability of a fault and combine this with a yield model to evaluate the testability of an integrated circuit layout. They then integrate this technique with their performance driven routing algorithm to produce layouts that have optimal manufacturability while still meeting their performance specifications. Analog Layout Generation for Performance and Manufacturability will be of interest to analog engineers, researchers and students.
Author: Charles J. Drane
Publisher:
ISBN:
Category : Antennas, Dipole
Languages : en
Pages : 86
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Approximate representations for current and charge distributions along each dipole of a log-periodic dipole antenna are derived. The special mathematical forms assumed by these representations are chosen to be particularly compatible with the set of integral equations that the representations must satisfy. An attractive attributes is their ability to handle the rapid variations in charge that often exist near the driving points and ends of the dipole elements. This ability to accurately predict how charges are distributed can be essential to precise estimates of the maximum voltage gradient on the antenna, and is critically important when the antenna is to be designed for high-power applications.
Author: Robert William Beatty
Publisher:
ISBN:
Category : Electric measurements
Languages : en
Pages : 116
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Author: United States. National Bureau of Standards
Publisher:
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Category : Weights and measures
Languages : en
Pages : 524
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Author: T. K. Sarkar
Publisher: John Wiley & Sons
ISBN: 0471783013
Category : Technology & Engineering
Languages : en
Pages : 683
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Book Description
Important new insights into how various components and systems evolved Premised on the idea that one cannot know a science without knowing its history, History of Wireless offers a lively new treatment that introduces previously unacknowledged pioneers and developments, setting a new standard for understanding the evolution of this important technology. Starting with the background-magnetism, electricity, light, and Maxwell's Electromagnetic Theory-this book offers new insights into the initial theory and experimental exploration of wireless. In addition to the well-known contributions of Maxwell, Hertz, and Marconi, it examines work done by Heaviside, Tesla, and passionate amateurs such as the Kentucky melon farmer Nathan Stubblefield and the unsung hero Antonio Meucci. Looking at the story from mathematical, physics, technical, and other perspectives, the clearly written text describes the development of wireless within a vivid scientific milieu. History of Wireless also goes into other key areas, including: The work of J. C. Bose and J. A. Fleming German, Japanese, and Soviet contributions to physics and applications of electromagnetic oscillations and waves Wireless telegraphic and telephonic development and attempts to achieve transatlantic wireless communications Wireless telegraphy in South Africa in the early twentieth century Antenna development in Japan: past and present Soviet quasi-optics at near-mm and sub-mm wavelengths The evolution of electromagnetic waveguides The history of phased array antennas Augmenting the typical, Marconi-centered approach, History of Wireless fills in the conventionally accepted story with attention to more specific, less-known discoveries and individuals, and challenges traditional assumptions about the origins and growth of wireless. This allows for a more comprehensive understanding of how various components and systems evolved. Written in a clear tone with a broad scientific audience in mind, this exciting and thorough treatment is sure to become a classic in the field.
Author: Cristiano Calligaro
Publisher: CRC Press
ISBN: 1000793060
Category : Technology & Engineering
Languages : en
Pages : 417
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Book Description
Rad-hard Semiconductor Memories is intended for researchers and professionals interested in understanding how to design and make a preliminary evaluation of rad-hard semiconductor memories, making leverage on standard CMOS manufacturing processes available from different silicon foundries and using different technology nodes.In the first part of the book, a preliminary overview of the effects of radiation in space, with a specific focus on memories, will be conducted to enable the reader to understand why specific design solutions are adopted to mitigate hard and soft errors. The second part will be devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components with a specific focus on memories. The approach will follow a top-down scheme starting from RHBD at architectural level (how to build a rad-hard floor-plan), at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and at layout level (how to shape a layout to mitigate radiation effects).After the description of the mitigation techniques, the book enters in the core of the topic covering SRAMs (synchronous, asynchronous, single port and dual port) and PROMs (based on AntiFuse OTP technologies), describing how to design a rad-hard flash memory and fostering RHBD toward emerging memories like ReRAM. The last part will be a leap into emerging memories at a very early stage, not yet ready for industrial use in silicon but candidates to become an option for the next wave of rad-hard components. Technical topics discussed in the book include: Radiation effects on semiconductor components (TID, SEE) Radiation Hardening by Design (RHBD) Techniques Rad-hard SRAMs Rad-hard PROMs Rad-hard Flash NVMs Rad-hard ReRAMs Rad-hard emerging technologies
Author:
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ISBN:
Category : Physics
Languages : en
Pages : 124
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