High Voltage Electron Microscopy PDF Download
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Author: Peter Roland Swann
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 496
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Book Description
Author: Peter Roland Swann
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 496
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Book Description
Author: T. Imura
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 704
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Michael J. Dykstra
Publisher: Springer Science & Business Media
ISBN: 146840010X
Category : Science
Languages : en
Pages : 368
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Book Description
In this practical text, the author covers the fundamentals of biological electron microscopy - including fixation, instrumentation, and darkroom work - to provide an excellent introduction to the subject for the advanced undergraduate or graduate student.
Author: Hiroshi Fujita
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 576
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Book Description
Author: David C. Bell
Publisher: John Wiley & Sons
ISBN: 1118498488
Category : Science
Languages : en
Pages : 241
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Book Description
Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.
Author: Ludwig Reimer
Publisher: SPIE Press
ISBN: 9780819412065
Category : Science
Languages : en
Pages : 162
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Book Description
While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.
Author: Hiroshi Fujita
Publisher:
ISBN:
Category :
Languages : en
Pages : 507
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 673
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Book Description
Author: James Pawley
Publisher: Springer Science & Business Media
ISBN: 0387729720
Category : Science
Languages : en
Pages : 323
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Book Description
Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. Although this imaging technique has undergone tremendous developments, it is still poorly represented in the literature, limited to journal articles and chapters in books. This comprehensive volume is dedicated to the theory and practical applications of FESEM in biological samples. It provides a comprehensive explanation of instrumentation, applications, and protocols, and is intended to teach the reader how to operate such microscopes to obtain the best quality images.
