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Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Author: Betty Prince
Publisher: Wiley
ISBN: 9780471956464
Category : Technology & Engineering
Languages : en
Pages : 306
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Book Description
Traditional Dynamic Random Access Memory Modules, or DRAMs, no longer have adequate bandwidth and access time to keep up with the speed of current microprocessors. In order to solve this problem, many work stations and mainframe manufacturers are starting to use high speed memories, which are memory technologies that improve the speed and efficiency of microprocessors. It is expected that high speed memories will be in widespread use within a few years.
Author: Betty Prince
Publisher: John Wiley & Sons
ISBN: 0471986100
Category : Technology & Engineering
Languages : en
Pages : 371
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Book Description
Die Bandbreite und Zugriffszeit traditioneller DRAMs reicht nicht mehr aus, um mit der Geschwindigkeit moderner Mikroprozessoren Schritt zu halten. Daher baut man verstärkt Hochleistungs-Speicherchips, deren neue Generation das Thema dieses Buches bildet. Die Autorin, eine international anerkannte Spezialistin, diskutiert objektiv und herstellerunabhängig Technologien wie DDR DRAMs, CiDDR DRAMs, SL=DRAM, Direct Rambus, SSTL Interfaces und MP-DRAMs. Der aktuellste verfügbare Beitrag zu einem enorm wichtigen Thema! (12/98)
Author: Betty Prince
Publisher: Springer Science & Business Media
ISBN: 0306475537
Category : Technology & Engineering
Languages : en
Pages : 290
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Book Description
Emerging Memories: Technologies and Trends attempts to provide background and a description of the basic technology, function and properties of emerging as well as discussing potentially suitable applications. This book explores a range of new memory products and technologies. The concept for some of these memories has been around for years. A few completely new. Some involve materials that have been in volume production in other type of devices for some time. Ferro-electrics, for example, have been used in capacitors for more than 30 years. In addition to looking at using known devices and materials in novel ways, there are new technologies being investigated such as DNA memories, light memories, molecular memories, and carbon nanotube memories, as well as the new polymer memories which hold the potential for the significant manufacturing reduction. Emerging Memories: Technologies and Trends is a useful reference for the professional engineer in the semiconductor industry.
Author: Said Hamdioui
Publisher: Springer Science & Business Media
ISBN: 1475767064
Category : Technology & Engineering
Languages : en
Pages : 231
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Book Description
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Author: Ashok K. Sharma
Publisher: Wiley-IEEE Press
ISBN: 9780780310001
Category : Technology & Engineering
Languages : en
Pages : 480
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Book Description
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
Author: Rino Micheloni
Publisher: Springer Science & Business Media
ISBN: 9048194318
Category : Technology & Engineering
Languages : en
Pages : 582
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Book Description
Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just imagine how our recent habits would change if the NAND memories suddenly disappeared. To take a picture it would be necessary to find a film (as well as a traditional camera...), disks or even magnetic tapes would be used to record a video or to listen a song, and a cellular phone would return to be a simple mean of communication rather than a multimedia console. The development of NAND Flash memories will not be set down on the mere evolution of personal entertainment systems since a new killer application can trigger a further success: the replacement of Hard Disk Drives (HDDs) with Solid State Drives (SSDs). SSD is made up by a microcontroller and several NANDs. As NAND is the technology driver for IC circuits, Flash designers and technologists have to deal with a lot of challenges. Therefore, SSD (system) developers must understand Flash technology in order to exploit its benefits and countermeasure its weaknesses. Inside NAND Flash Memories is a comprehensive guide of the NAND world: from circuits design (analog and digital) to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from error correction codes to NAND applications like Flash cards and SSDs.
Author: Steven A. Przybylski
Publisher: Morgan Kaufmann
ISBN: 1558601368
Category : Computers
Languages : en
Pages : 1017
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Book Description
A widely read and authoritative book for hardware and software designers. This innovative book exposes the characteristics of performance-optimal single- and multi-level cache hierarchies by approaching the cache design process through the novel perspective of minimizing execution time.
Author: Konrad Kokosa
Publisher: Apress
ISBN: 1484240278
Category : Computers
Languages : en
Pages : 1091
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Book Description
Understand .NET memory management internal workings, pitfalls, and techniques in order to effectively avoid a wide range of performance and scalability problems in your software. Despite automatic memory management in .NET, there are many advantages to be found in understanding how .NET memory works and how you can best write software that interacts with it efficiently and effectively. Pro .NET Memory Management is your comprehensive guide to writing better software by understanding and working with memory management in .NET. Thoroughly vetted by the .NET Team at Microsoft, this book contains 25 valuable troubleshooting scenarios designed to help diagnose challenging memory problems. Readers will also benefit from a multitude of .NET memory management “rules” to live by that introduce methods for writing memory-aware code and the means for avoiding common, destructive pitfalls. What You'll LearnUnderstand the theoretical underpinnings of automatic memory management Take a deep dive into every aspect of .NET memory management, including detailed coverage of garbage collection (GC) implementation, that would otherwise take years of experience to acquire Get practical advice on how this knowledge can be applied in real-world software development Use practical knowledge of tools related to .NET memory management to diagnose various memory-related issuesExplore various aspects of advanced memory management, including use of Span and Memory types Who This Book Is For .NET developers, solution architects, and performance engineers
Author: Robert C. Post
Publisher: JHU Press
ISBN: 9780801866647
Category : Science
Languages : en
Pages : 460
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Book Description
Providing a firsthand history of the sport, this book takes a detailed look at all aspects of drag racing: the sport, the business, and tracks the innovations that permitted racers to disprove the "laws of physics". 147 halftones.
