High-accuracy, High-speed Measurement of Deep Submicron and Nano-structure Gratings Using Specular Reflected Light Techniques

High-accuracy, High-speed Measurement of Deep Submicron and Nano-structure Gratings Using Specular Reflected Light Techniques PDF Author: Hsu-Ting Huang
Publisher:
ISBN:
Category :
Languages : en
Pages : 336

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High-accuracy, High-speed Measurement of Deep Submicron and Nano-structure Gratings Using Specular Reflected Light Techniques

High-accuracy, High-speed Measurement of Deep Submicron and Nano-structure Gratings Using Specular Reflected Light Techniques PDF Author: Hsu-Ting Huang
Publisher:
ISBN:
Category :
Languages : en
Pages : 336

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Book Description


Nonlinear Filtering for Real-time Sensing of Patterned Wafers

Nonlinear Filtering for Real-time Sensing of Patterned Wafers PDF Author: Ji-Woong Lee
Publisher:
ISBN:
Category :
Languages : en
Pages : 210

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Dissertation Abstracts International

Dissertation Abstracts International PDF Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 652

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Optics in Our Time

Optics in Our Time PDF Author: Mohammad D. Al-Amri
Publisher: Springer
ISBN: 3319319035
Category : Science
Languages : en
Pages : 509

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Book Description
Light and light based technologies have played an important role in transforming our lives via scientific contributions spanned over thousands of years. In this book we present a vast collection of articles on various aspects of light and its applications in the contemporary world at a popular or semi-popular level. These articles are written by the world authorities in their respective fields. This is therefore a rare volume where the world experts have come together to present the developments in this most important field of science in an almost pedagogical manner. This volume covers five aspects related to light. The first presents two articles, one on the history of the nature of light, and the other on the scientific achievements of Ibn-Haitham (Alhazen), who is broadly considered the father of modern optics. These are then followed by an article on ultrafast phenomena and the invisible world. The third part includes papers on specific sources of light, the discoveries of which have revolutionized optical technologies in our lifetime. They discuss the nature and the characteristics of lasers, Solid-state lighting based on the Light Emitting Diode (LED) technology, and finally modern electron optics and its relationship to the Muslim golden age in science. The book’s fourth part discusses various applications of optics and light in today's world, including biophotonics, art, optical communication, nanotechnology, the eye as an optical instrument, remote sensing, and optics in medicine. In turn, the last part focuses on quantum optics, a modern field that grew out of the interaction of light and matter. Topics addressed include atom optics, slow, stored and stationary light, optical tests of the foundation of physics, quantum mechanical properties of light fields carrying orbital angular momentum, quantum communication, and Wave-Particle dualism in action.

Plasmonics: Fundamentals and Applications

Plasmonics: Fundamentals and Applications PDF Author: Stefan Alexander Maier
Publisher: Springer Science & Business Media
ISBN: 0387378251
Category : Technology & Engineering
Languages : en
Pages : 234

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Book Description
Considered a major field of photonics, plasmonics offers the potential to confine and guide light below the diffraction limit and promises a new generation of highly miniaturized photonic devices. This book combines a comprehensive introduction with an extensive overview of the current state of the art. Coverage includes plasmon waveguides, cavities for field-enhancement, nonlinear processes and the emerging field of active plasmonics studying interactions of surface plasmons with active media.

High Resolution Imaging in Microscopy and Ophthalmology

High Resolution Imaging in Microscopy and Ophthalmology PDF Author: Josef F. Bille
Publisher: Springer
ISBN: 3030166384
Category : Medical
Languages : en
Pages : 411

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Book Description
This open access book provides a comprehensive overview of the application of the newest laser and microscope/ophthalmoscope technology in the field of high resolution imaging in microscopy and ophthalmology. Starting by describing High-Resolution 3D Light Microscopy with STED and RESOLFT, the book goes on to cover retinal and anterior segment imaging and image-guided treatment and also discusses the development of adaptive optics in vision science and ophthalmology. Using an interdisciplinary approach, the reader will learn about the latest developments and most up to date technology in the field and how these translate to a medical setting. High Resolution Imaging in Microscopy and Ophthalmology – New Frontiers in Biomedical Optics has been written by leading experts in the field and offers insights on engineering, biology, and medicine, thus being a valuable addition for scientists, engineers, and clinicians with technical and medical interest who would like to understand the equipment, the applications and the medical/biological background. Lastly, this book is dedicated to the memory of Dr. Gerhard Zinser, co-founder of Heidelberg Engineering GmbH, a scientist, a husband, a brother, a colleague, and a friend.

Remote Compositional Analysis

Remote Compositional Analysis PDF Author: Janice L. Bishop
Publisher: Cambridge University Press
ISBN: 110718620X
Category : Language Arts & Disciplines
Languages : en
Pages : 655

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Book Description
Comprehensive overview of the spectroscopic, mineralogical, and geochemical techniques used in planetary remote sensing.

X-Ray Metrology in Semiconductor Manufacturing

X-Ray Metrology in Semiconductor Manufacturing PDF Author: D. Keith Bowen
Publisher: CRC Press
ISBN: 1420005650
Category : Technology & Engineering
Languages : en
Pages : 297

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Book Description
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.

Computational Photography

Computational Photography PDF Author: Ramesh Raskar
Publisher: A K Peters/CRC Press
ISBN: 9781568813134
Category : Computers
Languages : en
Pages : 0

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Book Description
Computational Photography combines plentiful computing, digital sensors, modern optics, actuators, probes, and smart lights to escape the limitations of traditional film cameras and enables novel imaging applications. This book provides a practical guide to topics in image capture and manipulation methods for generating compelling pictures for graphics, special effects, scene comprehension, and art. The computational techniques discussed cover topics in exploiting new ideas in manipulating optics, illumination, and sensors at time of capture. In addition, the authors describe sophisticated reconstruction procedures from direct and indirect pixel measurements that go well beyond the traditional digital darkroom experience.

Nondestructive Materials Characterization

Nondestructive Materials Characterization PDF Author: Norbert G. H. Meyendorf
Publisher: Springer Science & Business Media
ISBN: 3662089882
Category : Science
Languages : en
Pages : 435

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Book Description
With an emphasis on aircraft materials, this book describes techniques for the material characterization to detect and quantify degradation processes such as corrosion and fatigue. It introduces readers to these techniques based on x-ray, ultrasonic, optical and thermal principles and demonstrates the potential of the techniques for a wide variety of applications concerning aircraft materials, especially aluminum and titanium alloys. The advantages and disadvantages of various techniques are evaluated.