Handbook of Modern Ion Beam Materials Analysis PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Handbook of Modern Ion Beam Materials Analysis PDF full book. Access full book title Handbook of Modern Ion Beam Materials Analysis by Yongqiang Wang. Download full books in PDF and EPUB format.
Author: Yongqiang Wang
Publisher: Materials Research Society
ISBN: 9781605112152
Category : Technology & Engineering
Languages : en
Pages : 0
Get Book Here
Book Description
The Handbook of Modern Ion Beam Materials Analysis, Second Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis. The book is an excellent introduction to the fundamentals and lab practices of ion beam analysis and is also useful as a teaching text for undergraduate senior or first-year graduate students. This text is a comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis. In addition, the DVD includes bonus info - both the Ion Beam Analysis Nuclear Data Library (IBANDL) and GUPIX Subroutines (CSA and YLS) for X-ray Database.
Author: Yongqiang Wang
Publisher: Materials Research Society
ISBN: 9781605112152
Category : Technology & Engineering
Languages : en
Pages : 0
Get Book Here
Book Description
The Handbook of Modern Ion Beam Materials Analysis, Second Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis. The book is an excellent introduction to the fundamentals and lab practices of ion beam analysis and is also useful as a teaching text for undergraduate senior or first-year graduate students. This text is a comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis. In addition, the DVD includes bonus info - both the Ion Beam Analysis Nuclear Data Library (IBANDL) and GUPIX Subroutines (CSA and YLS) for X-ray Database.
Author: Y. Wang
Publisher: Materials Research Society
ISBN: 9781605112176
Category : Technology & Engineering
Languages : en
Pages :
Get Book Here
Book Description
The Handbook of Modern Ion Beam Materials Analysis, 2nd Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis. It provides an excellent introduction to the fundamentals and lab practices of ion beam analysis and is also useful as a teaching text for undergraduate senior or first-year graduate students This text is a comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis. In addition, the DVD includes bonus info - both the Ion Beam Analysis Nuclear Data Library (IBANDL) and GUPIX Subroutines (CSA and YLS) for X-ray Database.
Author: Joseph R. Tesmer
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 728
Get Book Here
Book Description
The Handbook of Modern Ion Beam Materials Analysis is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. The book's 13 chapters cover discussions and examples, while 18 appendices provide extensive compilations of relevant data. Numerous techniques are discussed, including elastic recoil detection and activation analysis. Material in the book pushes the boundaries of ion-beam analysis to higher energies. The detection of light elements is emphasized, and background materials in the areas of energy loss, nuclear theory, instrumentation, analysis pitfalls and radiation safety are also provided for a better understanding of the principles basic to the techniques.
Author: Michael Nastasi
Publisher: CRC Press
ISBN: 1439846383
Category : Science
Languages : en
Pages : 476
Get Book Here
Book Description
Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology. Examines classical collision theory Details the fundamentals of five specific ion beam analysis techniques Illustrates specific applications, including biomedicine and thin film analysis Provides examples of ion beam analysis in traditional and emerging research fields Supplying readers with the means to understand the benefits and limitations of IBA, the book offers practical information that users can immediately apply to their own work. It covers the broad range of current and emerging applications in materials science, physics, art, archaeology, and biology. It also includes a chapter on computer applications of IBA.
Author: Bernd Schmidt
Publisher: Springer Science & Business Media
ISBN: 3211993568
Category : Technology & Engineering
Languages : en
Pages : 425
Get Book Here
Book Description
A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning is treated in detail. Its applications in materials research, development and analysis, developments of special techniques and interaction mechanisms of ion beams with solid state matter result in the optimization of new material properties, which are discussed thoroughly. Solid-state properties optimization for functional materials such as doped semiconductors and metal layers for nano-electronics, metal alloys, and nano-patterned surfaces is demonstrated. The ion beam is an important tool for both materials processing and analysis. Researchers engaged in solid-state physics and materials research, engineers and technologists in the field of modern functional materials will welcome this text.
Author: Harry Bernas
Publisher: Springer Science & Business Media
ISBN: 354088789X
Category : Technology & Engineering
Languages : en
Pages : 386
Get Book Here
Book Description
Materials science is the prime example of an interdisciplinary science. It - compasses the ?elds of physics, chemistry, material science, electrical en- neering, chemical engineering and other disciplines. Success has been o- standing. World-class accomplishments in materials have been recognized by NobelprizesinPhysicsandChemistryandgivenrisetoentirelynewtechno- gies. Materials science advances have underpinned the technology revolution that has driven societal changes for the last ?fty years. Obviouslytheendisnotinsight!Futuretechnology-basedproblemsd- inatethecurrentscene.Highonthelistarecontrolandconservationofenergy and environment, water purity and availability, and propagating the inf- mation revolution. All fall in the technology domain. In every case proposed solutions begin with new forms of materials, materials processing or new arti?cial material structures. Scientists seek new forms of photovoltaics with greater e?ciency and lower cost. Water purity may be solved through surface control, which promises new desalination processes at lower energy and lower cost. Revolutionary concepts to extend the information revolution reside in controlling the “spin” of electrons or enabling quantum states as in quantum computing. Ion-beam experts make substantial contributions to all of these burgeoning sciences.
Author: Wolfgang von der Linden
Publisher: Springer Science & Business Media
ISBN: 9401147108
Category : Mathematics
Languages : en
Pages : 380
Get Book Here
Book Description
In 1978 Edwin T. Jaynes and Myron Tribus initiated a series of workshops to exchange ideas and recent developments in technical aspects and applications of Bayesian probability theory. The first workshop was held at the University of Wyoming in 1981 organized by C.R. Smith and W.T. Grandy. Due to its success, the workshop was held annually during the last 18 years. Over the years, the emphasis of the workshop shifted gradually from fundamental concepts of Bayesian probability theory to increasingly realistic and challenging applications. The 18th international workshop on Maximum Entropy and Bayesian Methods was held in Garching / Munich (Germany) (27-31. July 1998). Opening lectures by G. Larry Bretthorst and by Myron Tribus were dedicated to one of th the pioneers of Bayesian probability theory who died on the 30 of April 1998: Edwin Thompson Jaynes. Jaynes revealed and advocated the correct meaning of 'probability' as the state of knowledge rather than a physical property. This inter pretation allowed him to unravel longstanding mysteries and paradoxes. Bayesian probability theory, "the logic of science" - as E.T. Jaynes called it - provides the framework to make the best possible scientific inference given all available exper imental and theoretical information. We gratefully acknowledge the efforts of Tribus and Bretthorst in commemorating the outstanding contributions of E.T. Jaynes to the development of probability theory.
Author: Devesh Kumar Avasthi
Publisher: Springer Science & Business Media
ISBN: 9400712294
Category : Science
Languages : en
Pages : 292
Get Book Here
Book Description
Ion beams have been used for decades for characterizing and analyzing materials. Now energetic ion beams are providing ways to modify the materials in unprecedented ways. This book highlights the emergence of high-energy swift heavy ions as a tool for tailoring the properties of materials with nanoscale structures. Swift heavy ions interact with materials by exciting/ionizing electrons without directly moving the atoms. This opens a new horizon towards the 'so-called' soft engineering. The book discusses the ion beam technology emerging from the non-equilibrium conditions and emphasizes the power of controlled irradiation to tailor the properties of various types of materials for specific needs.
Author: Hans Kuzmany
Publisher: Springer Science & Business Media
ISBN: 3662035944
Category : Science
Languages : en
Pages : 455
Get Book Here
Book Description
This text is an introductory compilation of basic concepts, methods and applications in the field of spectroscopy. It discusses new radiation sources such as lasers and synchrotrons and describes the linear response together with the basic principles and the technical background for various scattering experiments.
Author: Kannan M. Krishnan
Publisher: Oxford University Press
ISBN: 0192566083
Category : Science
Languages : en
Pages : 550
Get Book Here
Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
