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Author:
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 844
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Book Description
Author:
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 844
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Book Description
Author: Bernard Pichaud
Publisher: Trans Tech Publications Ltd
ISBN: 303813029X
Category : Technology & Engineering
Languages : en
Pages : 789
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Book Description
GADEST 2005 Proceedings of the 11th International Autumn Meeting, Giens, France, September 25-30, 2005
Author: M. Kittler
Publisher: Trans Tech Publications Ltd
ISBN: 3035703019
Category : Technology & Engineering
Languages : en
Pages : 659
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Book Description
Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991
Author: Martin Kittler
Publisher: Scitec Publications
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 634
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Book Description
Author: S. Ashok
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1176
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Book Description
Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR
Author: David Fisher
Publisher: Trans Tech Publications Ltd
ISBN: 3038130338
Category : Technology & Engineering
Languages : en
Pages : 301
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Book Description
This eighth volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective VII (Volumes 230-232) and the end of 2005 (allowing for vagaries of journal availability).
Author: Victor A. Perevostchikov
Publisher: Springer Science & Business Media
ISBN: 9783540262442
Category : Science
Languages : en
Pages : 412
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Book Description
Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; – to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; – to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid–state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.
Author:
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 364
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Book Description
Author: J.D. Murphy
Publisher: Trans Tech Publications Ltd
ISBN: 3038262056
Category : Technology & Engineering
Languages : en
Pages : 513
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Book Description
GADEST 2013 Selected, peer reviewed papers from the 15th Gettering and Defect Engineering in Semiconductor Technology (GADEST 2013), September 22-27, 2013, Oxford, UK
Author: Alexei Nazarov
Publisher: Springer
ISBN: 3319088041
Category : Technology & Engineering
Languages : en
Pages : 464
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Book Description
This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications such as telecommunications, radiation control, biomedical instrumentation and chemical analysis. In this book, new approaches exploiting nanotechnologies (such as UTBB FD SOI, Fin FETs, nanowires, graphene or carbon nanotubes on dielectric) to pave a way between “More Moore” and “More than Moore” are considered, in order to create different kinds of sensors and devices which will consume less electrical power, be more portable and totally compatible with modern microelectronics products.
