Gettering and Defect Engineering in Semiconductor Technology IX PDF Download
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Author: Vito Raineri
Publisher: Trans Tech Publications Ltd
ISBN: 3035707073
Category : Technology & Engineering
Languages : en
Pages : 809
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Book Description
GADEST 2001 Proceedings of the 9th Int. Conference on Gettering anf Defect Engineering in Semiconductor Technology , S. Tecla, Italy
Author: Vito Raineri
Publisher: Trans Tech Publications Ltd
ISBN: 3035707073
Category : Technology & Engineering
Languages : en
Pages : 809
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Book Description
GADEST 2001 Proceedings of the 9th Int. Conference on Gettering anf Defect Engineering in Semiconductor Technology , S. Tecla, Italy
Author: Bernard Pichaud
Publisher: Trans Tech Publications Ltd
ISBN: 303813029X
Category : Technology & Engineering
Languages : en
Pages : 789
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Book Description
GADEST 2005 Proceedings of the 11th International Autumn Meeting, Giens, France, September 25-30, 2005
Author: J.D. Murphy
Publisher: Trans Tech Publications Ltd
ISBN: 3038262056
Category : Technology & Engineering
Languages : en
Pages : 513
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Book Description
GADEST 2013 Selected, peer reviewed papers from the 15th Gettering and Defect Engineering in Semiconductor Technology (GADEST 2013), September 22-27, 2013, Oxford, UK
Author: M. Kittler
Publisher: Trans Tech Publications Ltd
ISBN: 3035703019
Category : Technology & Engineering
Languages : en
Pages : 659
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Book Description
Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991
Author: Cor Claeys
Publisher: Trans Tech Publications Ltd
ISBN: 3035706719
Category : Technology & Engineering
Languages : en
Pages : 530
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Book Description
GADEST 1997 Proceedings of the 7th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology (GADEST '97), Spa, Belgium, October 1997
Author:
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 856
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Book Description
Author: S. Ashok
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1176
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Book Description
Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR
Author: Victor A. Perevostchikov
Publisher: Springer Science & Business Media
ISBN: 9783540262442
Category : Science
Languages : en
Pages : 412
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Book Description
Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; – to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; – to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid–state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.
Author: Cor L. Claeys
Publisher: The Electrochemical Society
ISBN: 1566775043
Category : Crystal growth
Languages : en
Pages : 504
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Book Description
This issue discusses the latest developments in the growth, characterization, device processing and applications of high-purity silicon in either bulk or epitaxial form. Information is given on the control and prevention of impurity incorporation, characterization and detection of defects and impurity states. Device and circuit aspects are also covered. Advanced substrates such as SOI, strained Si and germanium-on-insulator are discussed.
Author: Yoshio Nishi
Publisher: CRC Press
ISBN: 1420017667
Category : Technology & Engineering
Languages : en
Pages : 1720
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Book Description
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
