Fundamentals Of Atomic Force Microscopy - Part I: Foundations PDF Download
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Author: Reifenberger Ronald G
Publisher: World Scientific
ISBN: 9814630373
Category : Technology & Engineering
Languages : en
Pages : 340
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Book Description
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Author: Reifenberger Ronald G
Publisher: World Scientific
ISBN: 9814630373
Category : Technology & Engineering
Languages : en
Pages : 340
Get Book
Book Description
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Author: Ronald G. Reifenberger
Publisher: World Scientific Publishing Company Incorporated
ISBN: 9789814630344
Category : Science
Languages : en
Pages : 350
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Book Description
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.
Author: Ronald Reifenberger
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Wesley C. Sanders
Publisher: CRC Press
ISBN: 1000707644
Category : Technology & Engineering
Languages : en
Pages : 154
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Book Description
This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.
Author: Arturo M. Baró
Publisher: John Wiley & Sons
ISBN: 3527327584
Category : Science
Languages : en
Pages : 385
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Book Description
About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
Author: Bert Voigtländer
Publisher: Springer
ISBN: 303013654X
Category : Science
Languages : en
Pages : 331
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Book Description
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Author: Peter Eaton
Publisher: Oxford University Press
ISBN: 0199570450
Category : Science
Languages : en
Pages : 257
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Book Description
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Author: Adil Denizli
Publisher: Elsevier
ISBN: 0443153604
Category : Science
Languages : en
Pages : 288
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Book Description
Approx.230 pages Approx.230 pages
Author: Bert Voigtländer
Publisher:
ISBN: 9783030136550
Category : Atomic force microscopy
Languages : en
Pages :
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Book Description
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Author: Avik Ghosh
Publisher: World Scientific
ISBN: 9811265976
Category : Science
Languages : en
Pages : 349
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Book Description
The Romans built enduring bridges well before Newton came along, armed simply with a working knowledge of mechanics and materials. In contrast, today's bridge building is an elaborate enterprise involving CAD tools, composite materials and acoustic imaging. When technology is pushed to its limits, a working knowledge proves inadequate, and an in-depth understanding of core physical principles, both macroscopic and microscopic, top-down vs bottom-up, becomes essential.We find ourselves today at a similar crossroad in semiconductor device technology, where a working knowledge of solid state electronics is no longer enough. Faced with the prohibitive cost of computing and the slowdown of chip manufacturing, device scaling and the global supply chain, the semiconductor industry is forced to explore alternate platforms such as 2-D materials, spintronics, analog processing and quantum engineering.This book combines top-down classical device physics with bottom-up quantum transport in a single venue to provide the basis for such a scientific exploration. It is essential, easy reading for beginning undergraduate and practicing graduate students, physicists unfamiliar with device engineering and engineers untrained in quantum physics. With just a modest pre-requisite of freshman maths, the book works quickly through key concepts in quantum physics, Matlab exercises and original homeworks, to cover a wide range of topics from chemical bonding to Hofstader butterflies, domain walls to Chern insulators, solar cells to photodiodes, FinFETs to Majorana fermions. For the practicing device engineer, it provides new concepts such as the quantum of resistance, while for the practicing quantum physicist, it provides new contexts such as the tunnel transistor.
