Fringe Pattern Analysis for Optical Metrology PDF Download
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Author: Manuel Servin
Publisher: John Wiley & Sons
ISBN: 3527411526
Category : Technology & Engineering
Languages : en
Pages : 344
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Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Author: Manuel Servin
Publisher: John Wiley & Sons
ISBN: 3527411526
Category : Technology & Engineering
Languages : en
Pages : 344
Get Book Here
Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Author: Manuel Servin
Publisher: John Wiley & Sons
ISBN: 3527681108
Category : Technology & Engineering
Languages : en
Pages : 344
Get Book Here
Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Author: Manuel Servín
Publisher:
ISBN: 9783527681075
Category : Diffraction patterns
Languages : en
Pages : 328
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Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Author: David W. Robinson
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 328
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Book Description
Very Good,No Highlights or Markup,all pages are intact.
Author: Qian Kemao
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819496430
Category : Technology & Engineering
Languages : en
Pages : 300
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Book Description
This book provides solutions to the challenges involved in fringe pattern analysis, covering techniques for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. Both theoretical analysis and algorithm development are covered to facilitate the work of researchers and engineers. The information presented is also appropriate as a specialized subject for students of optical and computer engineering.
Author: Pramod K. Rastogi
Publisher: Springer Science & Business Media
ISBN: 3540488006
Category : Science
Languages : en
Pages : 485
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Book Description
Presenting the use of photonics techniques for measurement in mechanics, this book provides a state-of-the-art review of this active and rapidly growing field. It serves as an invaluable resource for readers to explore the current status and includes a wealth of information on the essential principles and methods. It provides a substantial background in a concise and simple way to enable physicists and engineers to assess, analyze and implement experimental systems needed to solve their specific measurement problems.
Author: Kjell J. Gåsvik
Publisher: John Wiley & Sons
ISBN: 0470846704
Category : Technology & Engineering
Languages : en
Pages : 372
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Book Description
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.
Author: Alexis Lagarde
Publisher: Springer Science & Business Media
ISBN: 0306469480
Category : Science
Languages : en
Pages : 673
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Book Description
The request to organize under its patronage at Poitiers in 1998 a Symposium entitled “Advanced Optical Methods and Applications in Solid Mechanics” by the International Union of Theoretical and Applied Mechanics (I.U.T.A.M.) was well received for the following two reasons. First, for nearly 20 years no Symposium devoted to optical methods in solids had been organized. Second, recent advances in digital image processing provided many new applications which are described in the following. We have the honour to present here the proceedings of this Symposium. st th The Symposium took place from august 31 to September 4 at the Institut International de la Prospective in Futuroscope near Poitiers. A significant number of internationally renowned specialists had expressed their wish to participate in this meeting. The Scientific Committee proposed 16 general conferences and selected 33 regular lectures and 17 poster presentations. Papers corresponding to posters are not differentiated in the proceedings from those that were presented orally. It is worth noting that a total of 80 participants, representing 16 countries, registered for this symposium.. The Scientific Committee deserves praise for attracting a significant number of young scientists, both as authors and as participants. Let us add our warm acknowledgements to Professor J.W. Dally and to Professor A.S. Kobayashi who, throughout the symposium preparation time, brought us valuable help.
Author: D.C. Williams
Publisher: Springer Science & Business Media
ISBN: 9401115648
Category : Technology & Engineering
Languages : en
Pages : 490
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Book Description
Optical methods, stimulated by the advent of inexpensive and reliable lasers, are assuming an increasingly important role in the field of engineering metrology. Requiring only a basic knowledge of optics, this text provides a compendium of practical information prepared by leaders in the field.
Author: Zacarias Malacara
Publisher: CRC Press
ISBN: 1351836919
Category : Science
Languages : en
Pages : 333
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Book Description
In this day of digitalization, you can work within the technology of optics without having to fully understand the science behind it. However, for those who wish to master the science, rather than merely be its servant, it's essential to learn the nuances, such as those involved with studying fringe patterns produced by optical testing interferometers. When Interferogram Analysis for Optical Testing originally came to print, it filled the need for an authoritative reference on this aspect of fringe analysis. That it was also exceptionally current and highly accessible made its arrival even more relevant. Of course, any book on something as cutting edge as interferogram analysis, no matter how insightful, isn't going to stay relevant forever. The second edition of Interferogram Analysis for Optical Testing is designed to meet the needs of all those involved or wanting to become involved in this area of advanced optical engineering. For those new to the science, it provides the necessary fundamentals, including basic computational methods for studying fringe patterns. For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education. Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.
