Feasibility of Diffraction Radiation for Non-invasive Micron-scale Transverse Beam Size Measurement in Circular Machines

Feasibility of Diffraction Radiation for Non-invasive Micron-scale Transverse Beam Size Measurement in Circular Machines PDF Author: Lorraine Bobb
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ISBN:
Category :
Languages : en
Pages :

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Feasibility of Diffraction Radiation for a Non-invasive Diagnostics of the SLAC Electron Beam

Feasibility of Diffraction Radiation for a Non-invasive Diagnostics of the SLAC Electron Beam PDF Author: M. Ross
Publisher:
ISBN:
Category :
Languages : en
Pages : 7

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The development of the non-invasive bunch size diagnostics based on the diffraction radiation is now in progress in frame of TPU-KEK-SLAC collaboration. The experimental test of a transverse beam size measurement was performed successful on the KEK-ATF extracted electron beam. However many difficulties emerge if we going from the one GeV electron energy to the several tenth GeV electron beams. The extremely high Lorenz-factor value gives rise to the some problems, such as large contribution of a radiation from an accelerator construction elements in submillimeter wavelength region, extremely pre-wave zone effect even in the optical range, exceeding of the electron beam divergence over the diffraction radiation cone, and so on. More over, the sensitivity of the method based on the optical diffraction radiation from flat slit target decrease catastrophic when an electron energy increase up to several tenth GeV. We suggest the new method based on the phase shift on the slit target, consisting on the two semi-planes which are turned at a some angle one to other (crossed target technique) and present here the results of experimental test of this technique. Also we discuss the origins of indicated difficulties and suggest the ways of these problems solution.

Beam Size Measurement by Optical Diffraction Radiation and Laser System for Compton Polarimeter

Beam Size Measurement by Optical Diffraction Radiation and Laser System for Compton Polarimeter PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 145

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Beam diagnostics is an essential constituent of any accelerator, so that it is named as "organs of sense" or "eyes of the accelerator." Beam diagnostics is a rich field. A great variety of physical effects or physical principles are made use of in this field. Some devices are based on electro-magnetic influence by moving charges, such as faraday cups, beam transformers, pick-ups; Some are related to Coulomb interaction of charged particles with matter, such as scintillators, viewing screens, ionization chambers; Nuclear or elementary particle physics interactions happen in some other devices, like beam loss monitors, polarimeters, luminosity monitors; Some measure photons emitted by moving charges, such as transition radiation, synchrotron radiation monitors and diffraction radiation-which is the topic of the first part of this thesis; Also, some make use of interaction of particles with photons, such as laser wire and Compton polarimeters-which is the second part of my thesis. Diagnostics let us perceive what properties a beam has and how it behaves in a machine, give us guideline for commissioning, controlling the machine and indispensable parameters vital to physics experiments. In the next two decades, the research highlight will be colliders (TESLA, CLIC, JLC) and fourth-generation light sources (TESLA FEL, LCLS, Spring 8 FEL) based on linear accelerator. These machines require a new generation of accelerator with smaller beam, better stability and greater efficiency. Compared with those existing linear accelerators, the performance of next generation linear accelerator will be doubled in all aspects, such as 10 times smaller horizontal beam size, more than 10 times smaller vertical beam size and a few or more times higher peak power. Furthermore, some special positions in the accelerator have even more stringent requirements, such as the interaction point of colliders and wigglor of free electron lasers. Higher performance of these accelerators increases the difficulty of diagnostics. For most cases, intercepting measurements are no longer acceptable, and nonintercepting method like synchrotron radiation monitor can not be applied to linear accelerators. The development of accelerator technology asks for simutanous diagnostics innovations, to expand the performance of diagnostic tools to meet the requirements of the next generation accelerators. Diffraction radiation and inverse Compton scattering are two of the most promising techniques, their nonintercepting nature avoids perturbance to the beam and damage to the instrumentation. This thesis is divided into two parts, beam size measurement by optical diffraction radiation and Laser system for Compton polarimeter. Diffraction radiation, produced by the interaction between the electric field of charged particles and the target, is related to transition radiation. Even though the theory of diffraction radiation has been discussed since 1960s, there are only a few experimental studies in recent years. The successful beam size measurement by optical diffraction radiation at CEBAF machine is a milestone: First of all, we have successfully demonstrated diffraction radiation as an effective nonintercepting diagnostics; Secondly, the simple linear relationship between the diffraction radiation image size and the actual beam size improves the reliability of ODR measurements; And, we measured the polarized components of diffraction radiation for the first time and I analyzed the contribution from edge radiation to diffraction radiation.

Diffraction Analysis of the Microstructure of Materials

Diffraction Analysis of the Microstructure of Materials PDF Author: Eric J. Mittemeijer
Publisher:
ISBN: 9783662067246
Category :
Languages : en
Pages : 580

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Guiding, Diffraction, and Confinement of Optical Radiation

Guiding, Diffraction, and Confinement of Optical Radiation PDF Author: Salvatore Solimeno
Publisher:
ISBN: 9780126543414
Category : Technology & Engineering
Languages : en
Pages : 620

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Analysis of Contribution from Edge Radiation to Optical Diffraction Radiation

Analysis of Contribution from Edge Radiation to Optical Diffraction Radiation PDF Author:
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ISBN:
Category :
Languages : en
Pages :

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Beam size measurement with near-field optical diffraction radiation (ODR) has been carried out successfully at CEBAF. The ODR station is installed on the Hall-A beam line after eight bending magnets. The ODR images were affected by an unexpected radiation. Some calculations for analyzing the source of the radiation will be presented. Furthermore, two schemes will be proposed to alleviate the contamination.

Diffraction Radiation from Relativistic Particles

Diffraction Radiation from Relativistic Particles PDF Author: Alexander Potylitsyn
Publisher: Springer Science & Business Media
ISBN: 3642125123
Category : Science
Languages : en
Pages : 285

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Book Description
This book deals with diffraction radiation, which implies the boundary problems of electromagnetic radiation theory. Diffraction radiation is generated when a charged particle moves near a target edge at a distance ( – Lorentz factor, – wave length). Diffraction radiation of non-relativistic particles is widely used to design intense emitters in the cm wavelength range. Diffraction radiation from relativistic charged particles is important for noninvasive beam diagnostics and design of free electron lasers based on Smith-Purcell radiation which is diffraction radiation from periodic structures. Different analytical models of diffraction radiation and results of recent experimental studies are presented in this book. The book may also serve as guide to classical electrodynamics applications in beam physics and electrodynamics. It can be of great use for young researchers to develop skills and for experienced scientists to obtain new results.

High Resolution Imaging in Microscopy and Ophthalmology

High Resolution Imaging in Microscopy and Ophthalmology PDF Author: Josef F. Bille
Publisher: Springer
ISBN: 3030166384
Category : Medical
Languages : en
Pages : 407

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Book Description
This open access book provides a comprehensive overview of the application of the newest laser and microscope/ophthalmoscope technology in the field of high resolution imaging in microscopy and ophthalmology. Starting by describing High-Resolution 3D Light Microscopy with STED and RESOLFT, the book goes on to cover retinal and anterior segment imaging and image-guided treatment and also discusses the development of adaptive optics in vision science and ophthalmology. Using an interdisciplinary approach, the reader will learn about the latest developments and most up to date technology in the field and how these translate to a medical setting. High Resolution Imaging in Microscopy and Ophthalmology – New Frontiers in Biomedical Optics has been written by leading experts in the field and offers insights on engineering, biology, and medicine, thus being a valuable addition for scientists, engineers, and clinicians with technical and medical interest who would like to understand the equipment, the applications and the medical/biological background. Lastly, this book is dedicated to the memory of Dr. Gerhard Zinser, co-founder of Heidelberg Engineering GmbH, a scientist, a husband, a brother, a colleague, and a friend.

Beam Acceleration In Crystals And Nanostructures - Proceedings Of The Workshop

Beam Acceleration In Crystals And Nanostructures - Proceedings Of The Workshop PDF Author: Gerard Mourou
Publisher:
ISBN: 9811217130
Category : Electronic books
Languages : en
Pages : 269

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Transmission Electron Microscopy

Transmission Electron Microscopy PDF Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Category : Technology & Engineering
Languages : en
Pages : 543

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Book Description
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.