Reliability Modeling: The RIAC Guide to Reliability Prediction, Assessment and Estimation PDF Download
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Author: William Denson
Publisher: RIAC
ISBN: 1933904178
Category : Technology & Engineering
Languages : en
Pages : 432
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Book Description
The intent of this book is to provide guidance on modeling techniques that can be used to quantify the reliability of a product or system. In this context, reliability modeling is the process of constructing a mathematical model that is used to estimate the reliability characteristics of a product. There are many ways in which this can be accomplished, depending on the product or system and the type of information that is available, or practical to obtain. This book reviews possible approaches, summarizes their advantages and disadvantages, and provides guidance on selecting a methodology based on the specific goals and constraints of the analyst. While this book will not discuss the use of specific published methodologies, in cases where examples are provided, tools and methodologies with which the author has personal experience in their development are used, such as life modeling, NPRD, MIL-HDBK-217 and the RIAC 217Plus--Introduction.
Author: William Denson
Publisher: RIAC
ISBN: 1933904178
Category : Technology & Engineering
Languages : en
Pages : 432
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Book Description
The intent of this book is to provide guidance on modeling techniques that can be used to quantify the reliability of a product or system. In this context, reliability modeling is the process of constructing a mathematical model that is used to estimate the reliability characteristics of a product. There are many ways in which this can be accomplished, depending on the product or system and the type of information that is available, or practical to obtain. This book reviews possible approaches, summarizes their advantages and disadvantages, and provides guidance on selecting a methodology based on the specific goals and constraints of the analyst. While this book will not discuss the use of specific published methodologies, in cases where examples are provided, tools and methodologies with which the author has personal experience in their development are used, such as life modeling, NPRD, MIL-HDBK-217 and the RIAC 217Plus--Introduction.
Author: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
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Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author: Franklin Richard Nash, Ph.D.
Publisher: CRC Press
ISBN: 1315353849
Category : Business & Economics
Languages : en
Pages : 713
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Book Description
This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.
Author: Titu I. Băjenescu
Publisher: Artech House
ISBN: 1596934360
Category : Technology & Engineering
Languages : en
Pages : 706
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Book Description
The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Author: Harold Gulliksen
Publisher: Routledge
ISBN: 1136460977
Category : Education
Languages : en
Pages : 509
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Book Description
This classic volume outlines, for both students and professionals, the mathematical theories and equations that are necessary for evaluating a test and for quantifying its characteristics. The author utilizes formulas that evaluate both the reliability and the validity of tests. He also provides the means for evaluating the reliability and validity of total test scores and individual item analysis. The work remains one of the only books on classical test theory to discuss applications, "true score" theory, the effect of test length on reliability and validity, and the effects of univariate and multivariate selection on validity.
Author: Robert Herrick
Publisher: Woodhead Publishing
ISBN: 0128192550
Category : Technology & Engineering
Languages : en
Pages : 336
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Book Description
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D. - Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry - Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products - Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more
Author: B.S. Dhillon
Publisher: CRC Press
ISBN: 1420042238
Category : Business & Economics
Languages : en
Pages : 265
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Book Description
Although Reliability Engineering can trace its roots back to World War II, its application to medical devices is relatively recent, and its treatment in the published literature has been quite limited. With the medical device industry among the fastest growing segments of the US economy, it is vital that the engineering, biomedical, manufacturing,
Author: Michael Tortorella
Publisher: John Wiley & Sons
ISBN: 1119058309
Category : Technology & Engineering
Languages : en
Pages : 464
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Book Description
Focuses on the core systems engineering tasks of writing,managing, and tracking requirements for reliability,maintainability, and supportability that are most likely to satisfycustomers and lead to success for suppliers This book helps systems engineers lead the development ofsystems and services whose reliability, maintainability, andsupportability meet and exceed the expectations of their customersand promote success and profit for their suppliers. This book isorganized into three major parts: reliability, maintainability, andsupportability engineering. Within each part, there is material onrequirements development, quantitative modelling, statisticalanalysis, and best practices in each of these areas. Heavy emphasisis placed on correct use of language. The author discusses the useof various sustainability engineering methods and techniques incrafting requirements that are focused on the customers’needs, unambiguous, easily understood by the requirements’stakeholders, and verifiable. Part of each major division of thebook is devoted to statistical analyses needed to determine whenrequirements are being met by systems operating in customerenvironments. To further support systems engineers in writing,analyzing, and interpreting sustainability requirements, this bookalso Contains “Language Tips” to help systems engineerslearn the different languages spoken by specialists andnon-specialists in the sustainability disciplines Provides exercises in each chapter, allowing the reader to tryout some of the ideas and procedures presented in the chapter Delivers end-of-chapter summaries of the current reliability,maintainability, and supportability engineering best practices forsystems engineers Reliability, Maintainability, and Supportability is a referencefor systems engineers and graduate students hoping to learn how toeffectively determine and develop appropriate requirements so thatdesigners may fulfil the intent of the customer.
Author:
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 644
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Book Description
Author: EDFAS Desk Reference Committee
Publisher: ASM International
ISBN: 1615037268
Category : Technology & Engineering
Languages : en
Pages : 673
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Book Description
Includes bibliographical references and index.
