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Author: Sten Hellström
Publisher: Springer Science & Business Media
ISBN: 3642803024
Category : Technology & Engineering
Languages : en
Pages : 204
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Book Description
This book on electrostatic discharge phenomena is essentially a translation and update ofa Swedish edition from 1992. The book is intended for people working with electronic circuits and equipments, in application and development. All personnel should be aware of the ESD-hazards, especially those responsible for quality. ESD-prevention is a part of TQM (Total Quality Management). The book is also usable for courses on the subject. Background It was soon realised that the MOS-circuits (MOS=Metal Oxide Semiconductor), which appeared in the beginning of the 1960-ties were sensitive to electrostatic discharges. But a severe accident accelerated the search for materials that do not generate electric charges. In April 1964 three people were working inside a satellite at Cape Kennedy Space Center. They suddenly screamed "we are burning". They died. The satellite incapsulation was covered with untreated plastics to protect against dust. When the plastics was pulled off both this and the metal incapsulating got charged. A discharge from the metal ignited inflammable parts of the satellite. Eleven more people were injured and the cost of the accident amounted to about 55 billions USD.
Author: Sten Hellström
Publisher: Springer Science & Business Media
ISBN: 3642803024
Category : Technology & Engineering
Languages : en
Pages : 204
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Book Description
This book on electrostatic discharge phenomena is essentially a translation and update ofa Swedish edition from 1992. The book is intended for people working with electronic circuits and equipments, in application and development. All personnel should be aware of the ESD-hazards, especially those responsible for quality. ESD-prevention is a part of TQM (Total Quality Management). The book is also usable for courses on the subject. Background It was soon realised that the MOS-circuits (MOS=Metal Oxide Semiconductor), which appeared in the beginning of the 1960-ties were sensitive to electrostatic discharges. But a severe accident accelerated the search for materials that do not generate electric charges. In April 1964 three people were working inside a satellite at Cape Kennedy Space Center. They suddenly screamed "we are burning". They died. The satellite incapsulation was covered with untreated plastics to protect against dust. When the plastics was pulled off both this and the metal incapsulating got charged. A discharge from the metal ignited inflammable parts of the satellite. Eleven more people were injured and the cost of the accident amounted to about 55 billions USD.
Author: Alessandro Birolini
Publisher: Springer Science & Business Media
ISBN: 3642149529
Category : Technology & Engineering
Languages : en
Pages : 626
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Book Description
27 Required function (mission profile) • Set up the reliability block diagram FMEA where (RBD), by performing a redundancy appears Eliminate reliability weaknesses • Determine the component stresses • component/material selection • Compute the failure rate Ai of each • derating component • screening • Compute R(t) at the assembly level • redundancy • Check the fulfillment of reliability design rules • Perform a preliminary design review no yes Go to the next assembly or to the next integration level Figure 2. 1 Reliability analysis procedure at assembly level Taking account of the above considerations, Fig. 2. 1 shows the reliability analysis procedure used in practical applications at assembly level. The proce dure of Fig. 2. 1 is based on the part stress method discussed in Section 2. 2. 4 (see Section 2. 2. 7 for the part count method). Also included are a failure modes and effect analysis (FMEA/FMECA), to check the validity of the assumed failure modes, and a verification of the adherence to design guidelines for relia bility in a preliminary design review (Section 5. 1, Appendices A3. 3. 5 & A4). Verification of the assumed failure modes is mandatory where redundancy appears, in particular because of the series element in the reliability block diagram (see for instance Example 2. 6, Sections 2. 3. 6 for elements with more than one failure mode & 6. 8. 7 for common cause failures, and Figs. 2. 8- 2. 9 & 6. 17- 6.
Author: A. Birolini
Publisher: Springer Science & Business Media
ISBN: 3662037920
Category : Technology & Engineering
Languages : en
Pages : 516
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Book Description
Reliability engineering is a rapidly evolving discipline, whose purpose is to develop methods and tools to predict, evaluate, and demonstrate reliability, maintainability, and availability of components, equipment, and systems, as well as to support development and production engineers in building in reliability and maintainability. To be cost and time effective, reliability engineering has to be coordinated with quality assurance activities, in agreement with Total Quality Management (TQM) and Concurrent Engineering efforts. To build in reliability and maintainability into complex equipment or systems, failure rate and failure mode analyses have to be performed early in the development phase and be supported by design guidelines for reliability, maintainability, and software quality as well as by extensive design reviews. Before production, qualification tests on prototypes are necessary to ensure that quality and reliability targets have been met. In the production phase, processes need to be selected and monitored to assure the required quality level. For many systems, availability requirements have also to be satisfied. In these cases, stochastic processes can be used to investigate and optimize availability. including logistical support as well. Software often plays a dominant role, requiring specific quality assurance activities. This book presents the state-of-the-art of reliability engineering, both in theory and practice. It is based on over 25 years experience of the author in this field, half of which was in industry and half as Professor for reliability engineering at the ETH (Swiss Federal Institute of Technology Zurich).
Author: Eugene Subbotsky
Publisher: Springer Nature
ISBN: 3030490084
Category : Psychology
Languages : en
Pages : 393
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Book Description
This book examines the role that human subjective experience plays in the creation of reality and introduces a new concept, the Bubble Universe, to describe the universe as it looks from the subjective viewpoint of an individual. Drawing on a range of research, the author questions the extent to which the scientific study of the origins of life, consciousness and subjective experience is itself influenced by scientists’ subjective worlds. The author argues that in many respects the Bubble Universe differs from the universe as described by science and religion, and analyzes these differences. The fabric and structure of subjective reality is described, and various aspects of the Bubble Universe are examined, including science, religion, life, morality and history. The differences between the views from inside the subjective universe and from scientific, religious and sociocultural versions of the universe are outlined, and their significance for practical and theoretical problems are highlighted and illustrated with psychological experiments. This book will be of value to all scholars interested in how subjectivity influences research and appeal in particular to those working in developmental and theoretical psychology, consciousness, epistemology, phenomenology, and the philosophy of science and of the mind.
Author: John R. Barnes
Publisher: Springer
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 400
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Book Description
If you design electronics for a living, you need Robust Electronic Design Reference Book. Written by a working engineer, who has put over 115 electronic products into production at Sycor, IBM, and Lexmark, Robust Electronic Design Reference covers all the various aspects of designing and developing electronic devices and systems that: -Work. -Are safe and reliable. -Can be manufactured, tested, repaired, and serviced. -May be sold and used worldwide. -Can be adapted or enhanced to meet new and changing requirements. Robust Electronic Design Reference Book is an electronics designer's reference library condensed into two volumes. It guides you through the entire process of: -Gathering user requirements. -Developing the design specification. -Partitioning the design into electronics, software, and other technologies. -Designing circuits for signal integrity, EMC, EMI, and ESD. -Choosing components and materials. -Reviewing the design. -Designing printed circuit boards, backplanes, and cables. -Bringing up prototypes. -Testing, characterizing, and refining your design. -Getting approvals. -Putting your product into production, or your equipment into service. Includes over 600 illustrations, nearly 200 tables, and an extensive Glossary and Index.
Author: R R Bowker Publishing
Publisher:
ISBN: 9780835240871
Category :
Languages : en
Pages : 1312
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Book Description
Author: Albert Wang
Publisher: John Wiley & Sons
ISBN: 1119850401
Category : Technology & Engineering
Languages : en
Pages : 436
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Book Description
An authoritative single-volume reference on the design and analysis of ESD protection for ICs Electrostatic discharge (ESD) is a major reliability challenge to semiconductors, integrated circuits (ICs), and microelectronic systems. On-chip ESD protection is a vital to any electronic products, such as smartphones, laptops, tablets, and other electronic devices. Practical ESD Protection Design provides comprehensive and systematic guidance on all major aspects of designs of on-chip ESD protection for integrated circuits (ICs). Written for students and practicing engineers alike, this one-stop resource covers essential theories, hands-on design skills, computer-aided design (CAD) methods, characterization and analysis techniques, and more on ESD protection designs. Detailed chapters examine an array of topics ranging from fundamental to advanced, including ESD phenomena, ESD failure analysis, ESD testing models, ESD protection devices and circuits, ESD design layout and technology effects, ESD design flows and co-design methods, ESD modelling and CAD techniques, and future ESD protection concepts. Based on the author’s decades of design, research and teaching experiences, Practical ESD Protection Design: • Features numerous real-world ESD protection design examples • Emphasizes on ESD protection design techniques and procedures • Describes ESD-IC co-design methodology for high-performance mixed-signal ICs and broadband radio-frequency (RF) ICs • Discusses CAD-based ESD protection design optimization and prediction using both Technology and Electrical Computer-Aided Design (TCAD/ECAD) simulation • Addresses new ESD CAD algorithms and tools for full-chip ESD physical design verification • Explores the disruptive future outlook of ESD protection Practical ESD Protection Design is a valuable reference for industrial engineers and academic researchers in the field, and an excellent textbook for electronic engineering courses in semiconductor microelectronics and integrated circuit designs.
Author: Michael Shur
Publisher: World Scientific
ISBN: 9789810223250
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
In many respects, compound semiconductor technology has reached the age of maturity when applications will have been defined, yields are high enough and well established, and gallium arsenide and related compounds have carved many important niches in electronics. This book reviews the state-of-the-art of compound semiconductor electronics. It covers the microwave, millimeter wave, and submillimeter wave devices, monolithic microwave and digital integrated circuits made from compound semiconductors and emerging wide band semiconductor materials. The book is written by leading experts in compound semiconductor electronics from industry and academia and strikes the balance between practical applications, record-breaking results, and design and modeling tools specific for compound semiconductor technology. Engineers, scientists, and graduate students working in solid state electronics and especially in the area of compound semiconductor electronics will find this book very useful. It could also be used as a text or a supplementary text for graduate courses in this field.
Author: Barrie D. Dunn
Publisher: Springer
ISBN: 3319233629
Category : Technology & Engineering
Languages : en
Pages : 677
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Book Description
The objective of this book is to assist scientists and engineers select the ideal material or manufacturing process for particular applications; these could cover a wide range of fields, from light-weight structures to electronic hardware. The book will help in problem solving as it also presents more than 100 case studies and failure investigations from the space sector that can, by analogy, be applied to other industries. Difficult-to-find material data is included for reference. The sciences of metallic (primarily) and organic materials presented throughout the book demonstrate how they can be applied as an integral part of spacecraft product assurance schemes, which involve quality, material and processes evaluations, and the selection of mechanical and component parts. In this successor edition, which has been revised and updated, engineering problems associated with critical spacecraft hardware and the space environment are highlighted by over 500 illustrations including micrographs and fractographs. Space hardware captured by astronauts and returned to Earth from long durations in space are examined. Information detailed in the Handbook is applicable to general terrestrial applications including consumer electronics as well as high reliability systems associated with aeronautics, medical equipment and ground transportation. This Handbook is also directed to those involved in maximizing the relia bility of new materials and processes for space technology and space engineering. It will be invaluable to engineers concerned with the construction of advanced structures or mechanical and electronic sub-systems.
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1164
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Book Description
